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面向模型检验的跨时钟域设计电路特性生成方法 被引量:2

Property Generation Method for Model Checking on Clock Domain Crossing Design
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摘要 对跨时钟域设计进行功能验证是SoC验证中的难点问题.传统的面向跨时钟域设计的模型检验方法并没有充分考虑电路特性描述的完整性问题,然而制订完整的电路特性是模型检验有效性的基础,不全面的电路特性描述将可能隐藏设计错误.为生成完整的描述跨时钟域设计的电路特性,本文首先提出基于有限状态自动机的电路特性生成方法;然后为缓解状态空间爆炸问题,提出基于亚稳态的数值化简策略.通过对两个典型的跨时钟域设计进行实验的结果表明,采用本文方法不仅能够达到100%的电路特性覆盖率,而且可以发现被传统方法隐藏的功能错误.同时模型检验的时间代价也能够得到大幅度降低. Verification on Clock Domain Crossing(CDC)design is crucial to the SoC functional verification.Traditional model checking methods on CDC design do not consider the completeness of properties.However,generating complete design properties is the basis for model checking,and incomplete properties would lead to bug escape.To generate complete properties for CDC design,we first propose a finite state automaton based property generation method.Then,to solve the exponential explosive problem,we propose a metastability based data type reduction strategy.Experiment results on two typical CDC designs show that,our approach not only achieves 100% property coverage,but also discovers a bug that escaped by traditional methods.Meanwhile,the verification time for model checking is greatly reduced.
出处 《电子学报》 EI CAS CSCD 北大核心 2009年第2期258-265,共8页 Acta Electronica Sinica
基金 国家863高技术研究发展计划(No.2006AA010202)
关键词 形式化验证 模型检验 跨时钟域设计 电路特性生成 formal verification model checking clock domain crossing design property generation
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参考文献15

  • 1Intel Corporation. Intel CE 2110 media processor[DB/OL]. http://www. intelconsumerelectronics. com/Technologies/ CE2110. aspx,2007 - 04 - 17/2007 - 12 - 27. 被引量:1
  • 2Charles Dike, Edward Burton. Miller and noise effects in a synchronizing flip-flop[ J ]. IEEE Journal of Solid-State Circuits, 1999,34(6) :849 - 855. 被引量:1
  • 3Rolf Drechsler. Advanced Formal Verification [ M ]. Norwell: Kluwer Academic Publishers, 2004. 被引量:1
  • 4Feng Yi, Zhou Zheng, Tong Dong, Cheng Xu. Clock domain crossing fault model and coverage metrics for validation of SoC design[ A]. Design, Automation & Test in Europe Conference & Exhibition[C]. San Jose: EDA Consortium, 2007. 1385 - 1390. 被引量:1
  • 5冯毅,易江芳,刘丹,佟冬,程旭.面向SoC系统芯片中跨时钟域设计的模型检验方法[J].电子学报,2008,36(5):886-892. 被引量:5
  • 6William K Lam. Hardware Design Verification: Simulation and Formal Method-Based Approaches [ M ]. Indiana: Prentice Hall PTR, 2005. 被引量:1
  • 7林惠民,张文辉.模型检测:理论、方法与应用[J].电子学报,2002,30(12A):1907-1912. 被引量:163
  • 8Y Hoskote, T Kam, PH Ho, X Zhao. Coverage estimation for symbolic model checking[ A ]. Proceedings of the 36th ACM/ IEEE Conference on Design Automation [ C ]. New York: ACM, 1999. 300 - 305. 被引量:1
  • 9KL McMillan. Verification of infinite state systems by compositional model checking[A]. Correct Hardware Design and Verification Methods[ C ]. Heidelberg: Springer, 1999. 219 - 234. 被引量:1
  • 10Tai Ly, Neil Hand, Chris Ka-kei Kwok. Formally verifying clock domain crossing jitter using assertion-based verification [A]. Design and Verification Conference[C]. San Jose: EDA Direct,2004.1 - 5. 被引量:1

二级参考文献15

  • 1严晓浪,郑飞君,葛海通,杨军.结合二叉判决图和布尔可满足性的等价性验证算法[J].电子学报,2004,32(8):1233-1235. 被引量:8
  • 2Intel Corporation. Intel CE 2110 media processor[DB/OL]. http://www. intelconsumerelectronics. com/Technologies/ CE2110. aspx, 2037-04-17/2007-08-07. 被引量:1
  • 3Michael Keating, Pierre Bricaud. Reuse Methodology Manual for System- on- a- Chip Designs ( Third Edition) [ M ]. Boston: Kluwer Academic Pubfisher, 2002. 239 - 264. 被引量:1
  • 4Feng Yi, Zhou Zheng, Tong Dong, Cheng Xu. Clock domain crossing fault model and coverage metrics for validation of SoC design[A]. Design, Automation & Test in Europe Conference & Exhibition[ C ]. San Jose: EDA Consortium, 2007. 1385 - 1390. 被引量:1
  • 5Kenneth L McMillan. Symbolic Model Checking: an Approach to the State Explosion Problem[ D]. Pittsburgh:Carnegie Mellon University, 1992. 被引量:1
  • 6Ying-Tsai Chang, Kwang-Ting(Tim) Cheng. Induction based gate level verification of multipliers [ A ]. Proceedings of the 2001 IEEE/ACM International Conference on Computer Aided Design[ C]. Piscataway: IEEE Press, 2001. 190 - 193. 被引量:1
  • 7Ran Ginosar. Fourteen ways to fool your synchronizer[ A]. Proceedings of Asynchronous Circuits and Systems[ C]. Washington: IEEE Computer Society, 2003.89- 91. 被引量:1
  • 8Q Zhang, IG Harris. A validation fault model for timing induced functional errors [ A ]. International Test Conference [ C ]. Washington:IEEE Computer Society, 2001.813 - 820. 被引量:1
  • 9Tai Ly, Neil Hand, Chris Ka-kei Kwok. Formally verifying clock domain crossing jitter using assertion-based verification [ A] .Design and Verification Conference[ C] .San Jose: EDA Direct,2004.1 - 5. 被引量:1
  • 10Tsachy Kapschitz, Ran Ginosar. Formal verification of synchronizers[A]. Proceedings of Correct Hardware Design and Verification Methods[ C ]. New York: Springer, 2005. 359 - 362. 被引量:1

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