摘要
在天然与人为辐射环境中,辐射可能在电子器件中引发瞬时电离、单粒子、位移损伤、总剂量等多种辐射效应,导致器件性能退化、功能异常、故障甚至损毁,是制约电子器件及所属系统长期、稳定、可靠工作的关键.核与空间辐射效应模拟试验技术是抗辐射加固的基础,可用于研究辐射效应机理、检验抗辐射加固方法有效性,是提升电子器件和系统抗辐射能力不可或缺的重要手段.本文从瞬时电离辐射效应模拟试验技术、空间单粒子效应模拟试验技术、位移损伤效应模拟试验技术、总剂量效应模拟试验技术四个方面出发,梳理了辐射效应研究和模拟试验装置现状,结合微电子工艺的发展趋势,分析提炼需要重点关注的科学问题与技术问题,为抗辐射加固技术创新发展提供参考.
Many types of radiation particles are found in natural and artificial radiation environments;for instance,protons,electrons,heavy ions and neutrons,gamma rays,and X-rays.These radiation particles may induce transient ionizing dose effects,single event effects,displacement damage,and total ionizing dose effects in electronic devices,resulting in performance degradation,function abnormality,malfunction,and even failure in systems containing these devices.For example,45%of the observed failures were due to radiation damage in artificial satellites working in space radiation environments.Thus,radiation damage plays a key role in restricting the long-term stability and reliability of electronic devices and the corresponding systems.Simulation test techniques for nuclear and space radiation effects are important foundations of radiation-hardness assurance studies,which can be useful for studying the basic mechanisms of radiation effects and estimating the effectiveness of hardness assurance methods,and indispensable for improving the reliability of electronics and the corresponding systems.In this study,four topics are presented,covering simulation test techniques for transient ionizing dose effects,single event effects,displacement damage,and total ionizing dose effects.For each topic,first,the status of radiation effect studies and experimental equipment suitability for performing radiation effect tests at home and abroad were reviewed.Second,the future development trends,along with the rapid progress in the field of microelectronics,were summarized based on information reported in references,and scientific and technical problems that should be heeded were raised and analyzed.This study can provide a reference for guiding the directions of radiation-hardness assurance.
作者
陈伟
罗尹虹
马武英
王晨辉
丁李利
王祖军
刘岩
梅博
姚崇斌
曾超
郭晓强
王忠明
吴伟
CHEN Wei;LUO Yin-Hong;MA Wu-Ying;WANG Chen-Hui;DING Li-Li;WANG ZuJun;LIU Yan;MEI Bo;YAO Chong-Bin;ZENG Chao;GUO Xiao-Qiang;WANG Zhong-Ming;WU Wei(National Key Laboratory of Intense Pulsed Radiation Simulation and Effect,Xi'an 710024,China;Northwest Institute of Nuclear Technology,Xi'an 710024,China;China Academy of Space Technology,Beijing 100029,China;Shanghai Aerospace Electronic Technology Institute,Shanghai 201108,China;Institute of Electronic Engineering,China Academy of Engineering Physics,Mianyang 621999,China)
出处
《中国科学：物理学、力学、天文学》
CSCD
北大核心
2023年第7期13-30,共18页
Scientia Sinica Physica,Mechanica & Astronomica
基金
国家自然科学基金(编号:11690040)资助项目。
关键词
核辐射效应
空间辐射效应
模拟试验技术
辐射模拟装置
nuclear radiation effects
space radiation effects
simulation test technique
equipments for radiation environment simulation
