摘要
目前国内的ADC测试系统只针对某一单款或几款ADC芯片进行设计,缺少通用的ADC测试平台。因此,提出了一种基于ZYNQ+FPGA的ADC通用测试平台,包含ADC可调电源、数据采集电路及上位机3部分,可以实现对不同电压、不同接口的ADC进行测试。对比芯片厂家的datasheet文件,最终验证了本测试平台对于高速高精度ADC动态性能参数测试的可行性。
At present,domestic ADC test systems are designed only for a single or several ADC chips,lacking a universal ADC test platform.Therefore,a universal test platform for ADC based on ZYNQ+FPGA is proposed,which consists of an ADC adjustable power supply,a data acquisition circuit and a host computer.It can test ADCs with different voltages and different interfaces.Finally,the comparison of the datasheet files from the chip manufacturer indicates the feasibility of test platform for the dynamic performance parameter test of high-speed and high-precision ADC.
作者
钱宏文
李凯
刘继祥
QIAN Hong-wen;LI Kai;LIU Ji-xiang(No.58 Institute of CETC,Wuxi Jiangsu 214035,China)
出处
《通信技术》
2019年第11期2829-2833,共5页
Communications Technology
