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近阈值标准单元库和其在传感网芯片中的应用

Near-Threshold Standard Cell Library and Its Application in Wireless Sensor Network SoC
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摘要 将电源电压降低到晶体管阈值电压附近可以有效提高数字电路的能效,而近阈值标准单元库是近阈值数字电路设计的基础。通过分析逻辑门间静态噪声容限的兼容性、逻辑门在宽电压范围下延时变化情况,并通过求解最大包问题等的相关算法,对现有的商用数字CMOS标准单元库进行有效筛选,得到适用于低电压工作的近阈值数字CMOS标准单元库。通过一个应用于传感网中的双电压域、双核微控制器流片测试,对此标准单元库进行了验证,结果显示其中工作在0.5 V下的高能效核的能量效率相较传统工作电压下提高到2.76倍。 Lowering the supply voltage to the transistor threshold region can improve the power efficiency of the digital circuit. Near-threshold standard cell library is the basis of the near-threshold digital circuit design. To establish the near-threshold CMOS library working in low voltage,a filtering method for the commercial normal voltage digital CMOS standard cell library was proposed by analyzing the compatibility of static noise margin of the connected logic gates and the delay variation in the operation voltage range,and solving the maximum clique problem and related problems. A dual-voltage dual-core microcontroller test chip was taped out to validate the library. The result shows that the high energy efficiency core under 0. 5 V supply voltage has a 2. 76 times energy efficiency improvement compared to that under the normal supply voltage.
出处 《半导体技术》 CAS CSCD 北大核心 2015年第12期889-893,915,共6页 Semiconductor Technology
基金 国家自然科学基金资助项目(61271269) 国家高技术研究发展计划(863计划)资助项目(2013AA01320) 北京市青年英才计划资助项目(YETP0102)
关键词 近阈值电路 数字电路 标准单元 静态噪声容限 传感网 near threshold circuit digital circuit standard cell static noise margin sensor network
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参考文献12

  • 1BHUNIA S, MUKHOPADHYAY S. Low-power varia- tion-tolerant design in nanometer silicon [ M ]. Berlin: Springer, 2011. 被引量:1
  • 2KAUL H, ANDERS M, HSU S, et al. Near-threshold voltage (NTV) design: opportunities and challenges [ C] // Proceedings of the 49'h Annual Design Automa- tion Conference. San Francisco, USA, 2012: 1153- 1158. 被引量:1
  • 3KAMAE N, MAHFUZUL ISLAM A K M, TSUCHIYA A, et al. A body bias generator with wide supply-range down to threshold vohage for within-die variability com- pensation [ C] // Proceedings of IEEE Asian Solid-State Circuits Conference (A-SSCC). KaoHsiung, China, 2014: 53-56. 被引量:1
  • 4JAIN S, KHARES, YADA S, et al. A280mV-to-l.2V wide-operating-range 1A-32 processor in 32nm CMOS [ C ] /// Proceedings of IEEE International Solid-State Circuits Conference Digest of Technical Papers (ISSCC). San Francisco, USA, 2012: 66-68. 被引量:1
  • 5HILL C. Noise margin and noise immunity in logic cir- cuits [J]. Microelectronics, 1968, 1 (5): 16-21. 被引量:1
  • 6YUAN J S, YANG L. Teaching digital noise and noise margin issues in engineering education [ J]. IEEE Tran- sactions on Education , 2005, 48 (1): 162-168. 被引量:1
  • 7DE VUSSER S, GENOE J, HEREMANS P. Influence of transistor parameters on the noise margin of organic digital circuits [ J]. IEEE Transactions on Electron De- vices, 2006, 53 (4): 601-610. 被引量:1
  • 8TAR JAN R. Depth-first search and linear graph algo- rithms [ J ]. SIAM Journal on Computing, 1972, 1 (2): 146- 160. 被引量:1
  • 9BOMZE I M, BUDINICH M, PARDALOS P M, et al. The maximum clique problem. Handbook of combinatorial optimization [M]. Berlin: Springer, 1999: 1-74. 被引量:1
  • 10KIM M, KIM K, GERACI J R, et al. Utilizationaware load balancing for the energy efficient operation of the big. LITTLE processor [C] ////Proceedings of the Con- ference on Design, Automation & Test in Europe. Dres- don, Germany, 2014: 223. 被引量:1

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