摘要
提出一种功耗限制下测试端口选择优化的方法,从而缩短测试时间。以系统功耗确定测试端口对数,以内核测试占用网络资源最少和测试时间最短为目标,为被测核选择端口位置。利用云进化算法对不同端口位置组合寻优,快速收敛到适应值最佳的测试端口组合,完成测试方法研究。以ITC’02基准电路作为实验对象,针对不同规模No C,实验结果表明,这种方法提高了测试效率,缩短了测试时间,降低了测试代价。
This paper proposed a method to select and optimize test ports for shortening test time,under the test power con- sumption constraints. It selected the appropriate number of the test ports according to the system power consumption con- straints, optimized location of the test ports for core to make the core test resources and test time minimum. Cloud based evolu- tion algorithm（CBEA） optimized different test ports combinations,strong convergence of CBEA enabled CBEA to be able to find accurate test ports within a short time, completed test method research. Experiments with ITC02 test circuits as the simula- tion object, experimental results of different scales NoC show that this way can improve the efficiency of test, shorten test time, and decrease the test cost.
出处
《计算机应用研究》
CSCD
北大核心
2015年第3期810-813,820,共5页
Application Research of Computers
关键词
片上网络
选择优化
云进化算法
network-on-chip
selecting optimization
cloud based evolution algorithm
