摘要
随着航天技术的发展,嵌入式系统在航天上得到了越来越广泛的应用。PROM作为航天相机电子学中存储数据的主要器件之一,其功能测试还依赖于使用硬件语言编写测试端口模块来完成,这种传统的方法不仅开发效率低,而且很难保证测试的可靠性。提出一种以嵌入式开发的方式实现PROM测试接口的方法,通过普通IO接口来模拟PROM接口时序,这种方法不仅提高了测试效率,而且提高了测试的可靠性、可配置性以及可移植性,大大降低了系统的研发成本。这种高效、低廉的测试实现方法,在航天电子学中有广泛的应用前景,同时,也适合于数据采集、工业自动化等应用。
With the development of science and technology, an embedded system is becoming more and more popular in aero-camera electronics. PROM is one of the most widely used memories, but its functional test still depends on writing testing module with hardware language, which results in low developing efficiency and low reliability. In this paper, an embedded testing method is proposed, which is not only more efficient and more reliable, but also easier to transplant. Experiment results prove the validity and feasibility of the method_
出处
《电子测量技术》
2013年第1期75-78,87,共5页
Electronic Measurement Technology
