摘要
介绍了一种康普顿散射法测量高强度直流X射线能谱的方法,分析了X光机辐射谱与散射谱强度的关系表达式。在测量系统中使用能量分辨能力较好的高纯锗探测器,通过测量X光机照射低原子序数材料的散射能谱,再根据不同能量X射线在该散射立体角上的散射截面回推,从而获得X光机的辐射能谱。最后,给出了X光机的工作电压分别为15、80和100 kV时,散射法测量得到的钨靶X射线辐射谱。
By the X-ray backscattering techniques, the method is described to measure energy spectrum of the high intensity continuous X-ray from X-ray generator, and establishes a intensity comparison expres- sion between the incident ray and backscatter ray. The scatter energy spectrum, when the generator op- erating voltage is 15, 80 and 100 kV, is measured by HPGe detector. Based on the scattering cross sec- tion of different energy X-ray, the energy spectrum of X-ray generator bremsstrahhmg is obtained.
出处
《核电子学与探测技术》
CAS
CSCD
北大核心
2010年第5期676-679,共4页
Nuclear Electronics & Detection Technology
关键词
X光机
散射法
能谱测量
X-ray generator, Compton scattering, Radiation spectrum
