摘要
应用干涉法实现光纤端面多层透明膜系反射率的测量。利用镀有反射膜的待测光纤端面,构成F-P干涉仪,根据透射光谱的自由谱宽和干涉峰的半宽值,计算出膜系反射率,可直接获得光纤端面上薄膜的真实反射率,并避免了光源波动对测量结果的影响。在用反射率为92％-98.6％的膜系所进行的实验中,测量误差小于-0.09％。分析了误差来源。
Reflectivity of multi-layer transparent films deposited on the end of optical fibers was measured using interferometry. Through a Fabry-Perot interferometer formed by the transparent films, the films' reality reflectivity to be measured was educed directly from the free spectral range and full width at half maximum of transmission spectrum. Thus the measurement error arise from light source power fluctuation was eliminated. The measurement error is less than -0.09% when the films' reflectivity lies between 92% and 98.6% in the experiment. Source of the measurement error was also analyzed.
出处
《中国仪器仪表》
2003年第3期4-6,共3页
China Instrumentation
