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光纤端面多层膜反射率的干涉测量方法研究

Study on Interferometry for Reflectivity of Multi-layer Dielectric-Films Grown on the End of Fibers
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摘要 为了解决光纤端面透明反射膜反射率的精确测量问题,利用镀有反射膜的待测光纤端面,构成法布里-珀罗(F-P)干涉仪,根据其透射光谱的自由谱宽和干涉峰的半宽值,计算出膜系反射率,避免了光源波动对测量结果的影响。在用反射率为92.0~98.6%的膜系所进行的实验中,测量误差小于0.09%。分析了误差来源。 To measure accurately the reflectivity of dielectric-films deposited on the end of fibers, Fabry-Perot (F-P) interferometers were built out of fiber ends with the transparent films, the films' reflectivity was educed from the free spectral range and full width at half maximum of transmission spectrum. Thus the measurement error arising from light source power fluctuation was eliminated. The measurement error is less than 0.09% when the films' reflectivity lay between 92.0% and 98.6% in the experiment. Source of the measurement error was also analyzed.
出处 《光电子.激光》 EI CAS CSCD 北大核心 2003年第4期399-401,共3页 Journal of Optoelectronics·Laser
关键词 光纤 反射率 法布里-珀罗干涉仪 透明薄膜 干涉测量方法 Error analysis Fabry Perot interferometers Optical fibers Reflection
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参考文献7

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