摘要
电子元器件受原材料和生产工艺等因素的影响,不同个体之间参数存在差异。参数分布与电子元器件的可靠性水平有紧密的关联,关键参数分布的一致性可以作为元器件选型依据之一并为后续应用和可靠性风险评估提供数据参考。介绍了一种参数一致性分析方法,先通过正态性检验和分布转换确保样本服从正态分布,然后基于正态分布和3σ原理完成一致性分析。分别对整流二极管和齐纳二极管的关键参数进行了参数一致性分析,并根据分析结果评估了这两种类型的二极管发生参数漂移的风险。
Electronic components are affected by raw materials and production process and other factors,and there are differences in parameters between different individuals.The parameter distribution is closely related to the reliability level of electronic components,and the consistency of the key parameter distribution can be used as one of the bases for selecting components and provide data reference for subsequent applications and reliability risk assessment.A parametric consistency analysis method is introduced,which first ensures that the sample obeys normal distribution through normality test and distribution transformation,and then completes the consistency analysis based on normal distribution and 3σprinciple.The consistency analysis of key parameters of rectifier diodes and Zener diodes are carried out,and the risk of parameter drift of these two types of diodes is assessed based on the results of the analysis.
作者
李家辉
苏锦冰
杨妙林
LI Jiahui;SU Jinbing;YANG Miaolin(CEPREI,Guangzhou 511370,China)
出处
《电子质量》
2024年第4期71-74,共4页
Electronics Quality
关键词
二极管
参数一致性
正态分布
可靠性
doide
parameter consistency
normal distribution
reliability
