摘要
阐述集成电路老化的试验原理、主流设备和标准。介绍GJB548要求、影响和异议。老化试验是一种无损试验,是剔除产品电测试不能识别的功能失效、参数漂移和存在潜在缺陷器件最有效的方法。
This paper describes the testing principles,mainstream equipment,and standards of integrated circuit aging.It introduces the requirements,impact,and objections of GJB548.Burn-in test is a non-destructive test that is the most effective method to eliminate functional failures,parameter drift,and potential defective devices that cannot be identified by product electrical testing.
作者
朱文鹏
张瑞
ZHU Wenpeng;ZHANG Rui(Xi'an Xigu Microelectronics Co.,Ltd.,Shaanxi 710077,China)
出处
《集成电路应用》
2024年第3期58-59,共2页
Application of IC
关键词
集成电路
功能失效
参数漂移
缺陷器件
integrated circuits
functional failure
parameter drift
defective devices
