摘要
反熔丝FPGA在生产阶段不能通过编程后测试对电路进行筛选,必须通过编程前测试来解决生产测试问题。在研究反熔丝FPGA多标准可配置I/O端口电路结构的基础上,提出了一种用于可配置I/O端口的可测性设计(DFT)方案,在可配置I/O端口中插入软配置电路和边界扫描链,实现对可配置端口的临时配置和扫描测试,覆盖所有支持的电平标准及各种可配置I/O功能。仿真及测试结果表明,该DFT能够满足反熔丝FPGA多标准可配置I/O端口的测试需求,能够解决可配置I/O在生产中的测试问题。
For screening,antifuse FPGA cannot be programmed at the production stage.The way of testing before programming must be adopted.Based on the research of the structure of multi-standard configurable I/O ports of antifuse FPGA,a design for testability(DFT)scheme for configurable I/O ports is proposed.By inserting soft-configured circuit and boundary scan chain into configurable I/O ports,the DFT can achieve temporary configuration and scanning test.All supported I/O level standards and configurable functions are covered.The simulation and test results show that the DFT can satisfy the testing demands of multi-standard configurable I/O ports and solve the problem of I/O testing for antifuse FPGA at the production stage.
作者
曹振吉
曹杨
隽扬
曹靓
马金龙
CAO Zhenji;CAO Yang;JUAN Yang;CAO Liang;MA Jinlong(China Electronics Technology Group Corporation No.58 Institute,Wuxi 214035,China)
出处
《电子与封装》
2023年第8期63-69,共7页
Electronics & Packaging
