期刊文献+

全Cu_(3)Sn焊点在高温时效下的组织及力学性能 被引量:1

Microstructure and mechanical property of full Cu 3Sn solder joints during high-temperature aging
下载PDF
导出
摘要 对全Cu_(3)Sn焊点进行620℃下不同持续时间的时效处理,研究时效过程中接头微观组织演变,并利用纳米压痕实验及剪切实验表征时效后焊点的力学性能变化。结果表明:在时效过程中,Cu/Cu_(3)Sn界面以平面状析出Cu_(20)Sn_(6)并持续生长,直至Cu_(3)Sn被完全消耗。随后Cu_(20)Sn_(6)向Cu_(20)Sn_(6)和Cu_(13.7)Sn组成的两相层转变,Cu_(13.7)Sn通过消耗两相层在Cu/两相层的界面处以波浪状析出并继续生长,直至占据整个界面区,该过程中伴随着焊缝中间位置孔洞数量和尺寸的生长,最终聚合成微裂纹。Cu_(20)Sn_(6),Cu_(3)Sn,Cu_(13.7)Sn相的硬度分别为9.62,7.15,4.67 GPa,弹性模量分别为146.5,134.0,133.2 GPa。随时效时间的增加,焊点的抗剪强度呈先增大后减小的趋势,在120 min内保持大于20.1 MPa;其断口形貌和断裂路径也随之发生变化。 620℃thermal aging was carried out on full Cu_(3)Sn solder joints for various duration,the microstructure evolution of solder joints were investigated.The mechanical properties of solder joints after aging were characterized by nano indentation test and shear test.The results show that,during the thermal aging,the Cu_(20)Sn_(6)is first precipitated in planar along Cu/Cu_(3)Sn interface,it grows continuously until the complete consumption of Cu_(3)Sn.Subsequently,Cu_(20)Sn_(6)transforms to two-phase layer,which consists of Cu_(20)Sn_(6)and Cu_(13.7)Sn.As the aging time increases,Cu_(13.7)Sn is precipitated in waves at the Cu/two-phase layer interface by consuming the two-phase layer and grows continuously until it occupies the entire interface area.Meanwhile,there is growth in the number and size of voids in the middle of the solder joint,which eventually coalesces into microcracks.The hardness of Cu_(20)Sn_(6),Cu_(3)Sn and Cu_(13.7)Sn phases are 9.62,7.15,4.67 GPa,and the elasticity modulus are 146.5,134.0,133.2 GPa,respectively.With the increase of aging time,the shear strength of solder joints increases first and then decreases,and remains more than 20.1 MPa within 120 min.The fracture morphology and fracture path also change.
作者 朱阳阳 李晓延 张伟栋 张虎 何溪 ZHU Yangyang;LI Xiaoyan;ZHANG Weidong;ZHANG Hu;HE Xi(Department of Materials and Manufacturing,Beijing University of Technology,Beijing 100124,China;China Nuclear Industry 23 Construction Co.,Ltd.,Beijing 101300,China)
出处 《材料工程》 EI CAS CSCD 北大核心 2022年第9期169-176,共8页 Journal of Materials Engineering
基金 国家自然科学基金资助项目(51975013)。
关键词 全Cu_(3)Sn焊点 高温时效 瞬时液相扩散焊 微观组织 抗剪强度 full Cu_(3)Sn solder joint high-temperature aging transient liquid phase diffusion welding microstructure shear strength
  • 相关文献

参考文献5

二级参考文献31

  • 1李晓延,严永长,史耀武.金属间化合物对SnAgCu/Cu界面破坏行为的影响[J].机械强度,2005,27(5):666-671. 被引量:27
  • 2SHANGGUAN D K. 无铅焊料互联及可靠性[M]. 北京:电子工业出版社,2008. 被引量:2
  • 3ANDERSSON C,TEGEHALL P E,ANDERSSON D R,et al.Thermal cycling aging effect on the shear strength,microstructure,intermetallic compounds (IMC) and crack initiation and propagation of reflow soldered Sn-3 8Ag-0 7Cu and wave soldered Sn-3.5Ag ceramic chip components[J].IEEE Transactions on Components and Packaging Technology,2008,31(2):331-344. 被引量:1
  • 4PANG J H L,XU L H,SHI X Q,et al.Intermetallic growth studies on Sn-Ag-Cu lead-free solder joints[J].Journal of Electronic Materials,2004,33(10):1219-1226. 被引量:1
  • 5DARVEAUX R,REICHMAN C,ISLAM N.Interface failure in lead free solder joints[A].2006 Proceedings.56th Electronic Components & Technology Conference[C].Piscataway:IEEE,2006.906-917. 被引量:1
  • 6XU L H,PANG J H L.Intermetallic growth studies on SAC/ENIG and SAC/Cu-OSP lead-free solder joints[A].2006 Proceedings.10th Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronics Systems[C].San Diego:IEEE,2006.1131-1136. 被引量:1
  • 7LIM G H,KWAN H F,SHI X Q.Intermetallic growth study on lead-free solder joint under thermal cycling and isothermal aging[A].2003 Electronics Packaging Technology Conference[C].Piscataway:IEEE,2003.578-583. 被引量:1
  • 8XU L H,PANG J H L,PRAKASH K H,et al.Isothermal and thermal cycling aging on IMC growth rate in lead-free and lead-based solder Interface[J].IEEE Transactions on Components and Packaging Technology,2005,28(3):408-414. 被引量:1
  • 9PANG J H L,PRAKASH K H,LOW T H.Isothermal and thermal cycling aging on IMC growth rate in Pb-free and Pb-based solder interfaces[A].The Ninth Intersociety Conference on Thermal and Thermomechanical Phenomena In Electronic Systems[C].Piscataway:IEEE,2004.109-115. 被引量:1
  • 10DUTTA I,KUMAR P,SUBBARAYAN G.Microstructural coarsening in Sn-Ag-based solders and its effects on mechanical properties[J].Journal of the Minerals,Metals and Materials Society,2009,61(6):29-38. 被引量:1

共引文献45

同被引文献6

引证文献1

二级引证文献1

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部