摘要
单粒子翻转(SEU)是影响空间电子设备可靠性的重要因素,本文提出了一种SEU甄别与定位技术方法,研制了原理样机。硅探测器与辐照敏感器件在垂直方向相互临近安装,粒子入射到硅探测器的位置区域与目标辐照器件单粒子翻转的物理位置相对应。采用波形数字化技术实现了多道粒子甄别与能量信号测量,通过数据回读比较法实现了SRAM器件翻转逻辑定位检测。根据实验室测试和单粒子辐照试验结果,可探测高能粒子的LET≥6.06×10^(-3) MeV·cm^(2)/mg,入射粒子的位置分辨率优于5 mm,最大计数率≥10000 s^(-1),SRAM器件的SEU巡检周期时间分辨率为13.76 ms。通过掌握大容量SRAM型器件的SEU甄别与定位及其辐射环境感知能力,有助于提升空间电子设备的在轨工作性能。
Single event upset(SEU)has always been an important factor affecting the reliability of spacecraft electronic equipment,which can cause anomalies in electronic equipment in orbit,and can result in serious spacecraft failure.In order to master signal event upset discriminating and positioning technology,and to study the mechanism between SEU physical position and particle energy,a technology method about SEU discriminating and positioning was proposed in this paper,and the principle prototype system was developed.The principle prototype system consists of silicon detector and electronics module.The silicon detector and the irradiation-sensitive device are mounted in close proximity to each other in the vertical direction,and the position region where the particles are incident to the silicon detector corresponds to the physical position of the logical upset of the target device.On the one hand,the silicon detector is divided into an array grid,electronics module includes multiple detection channels,and high-energy particles hitting a grid position of the silicon detector can be detected.On the other hand,the logical position of the target device where a single particle upset occurs can be detected by the circuit.Position sensitive detector is a silicon PIN type semiconductor particle detector dividing into a 4×4 array grid corresponding to each of the 16 measurement channels.Each grid is 4.5 mm wide square with a thickness of 300μm.The silicon detector is packaged on a PCB board,where the detector grids are connected to the pads of the PCB by gold wire crimping.The electronics module mainly includes pre-amplifier circuit,main amplifier and signal conditioning circuit,multichannel waveform signal peak-seeking circuit,particle-triggered circuit,SEU logic detection circuit for SRAM devices,FPGA control and communication circuit,etc.Waveform digitization technology is adopted,particle waveform peak value and particle arrival time are obtained through high speed analog-to-digital conversion and digital signal acquisi
作者
赵振栋
陶文泽
李衍存
成毅
张庆祥
安恒
全小平
张晨光
ZHAO Zhendong;TAO Wenze;LI Yancun;CHENG Yi;ZHANG Qingxiang;AN Heng;QUAN Xiaoping;ZHANG Chenguang(Lanzhou Institute of Physics,CAST,Lanzhou 730000,China;Beijing Institute of Spacecraft System Engineering,Beijing 100094,China;Chengdu University of Technology,Chengdu 610059,China)
出处
《原子能科学技术》
EI
CAS
CSCD
北大核心
2022年第4期749-757,共9页
Atomic Energy Science and Technology
基金
装备预先研究项目(30502040602)。
关键词
单粒子翻转
SRAM
甄别
定位
single event upset
SRAM
discriminating
positioning
