摘要
为解决卫星通信系统中赛灵思公司的静态随机存储器型现场可编程门阵列(Xilinx SRAMFPGA)单粒子翻转问题,提出了一种占用硬件资源少,可靠度高的抗单粒子方法.该方法使用爱特公司的现场可编程门阵列作为检测芯片,可编程只读存储器芯片存储屏蔽位文件,通过联合测试工作组模式回读Xilinx FPGA配置文件并进行校验,发现出错则重新加载配置文件,消除单粒子翻转影响.该方法已成功在轨应用于某卫星通信系统.为计算卫星通信系统的可靠度,提出使用品质因数方法预估静态随机存储器型现场可编程门阵列单粒子翻转率,并与在轨实测数据进行比较,证明使用该方法的正确性,同时计算出实际飞行轨道的单粒子翻转率系数,为其他静态随机存储器型现场可编程门阵列、存储器等芯片的单粒子翻转率预估提供数据支撑,为我国卫星通信系统可靠性研究与设计提供参考.
In order to solve the problem of Xilinx SRAM-FPGA Single Event Upsets（SEU） in the satellite communication system, we design a less hardware resource and high timeliness method of using the Actel FPGA as the detecting chip. The PROM chip stores the mask bit, reads the Xilinx FPGA configuration file through JTAG and verifies the error. Then it reloads the configuration file to eliminate the SEU effect. The method is successfully applied to a satellite communication system. In order to calculate the reliability of the satellite communication system, the FOM method is used to predict the SEU rate in SRAM FPGA. The results show that this method can be used to calculate the SEU rate in the orbit. And the results can be used to predict the SEU rate in the other SRAM FPGA and Memory, and to provide reference for reliability research and design of China＇s satellite communication system.
出处
《西安电子科技大学学报》
EI
CAS
CSCD
北大核心
2018年第1期112-116,共5页
Journal of Xidian University
关键词
静态随机存储器型现场可编程门阵列
单粒子翻转
抗单粒子翻转方法
单粒子翻转率预估
static random access memory-field programmable gate array
single event upsets
single event upset mitigation method
single event upset rate prediction
