摘要
SRAM辐射效应测试装置由主机和下位计算机测试板构成,可在多种辐射源下进行SRAM单粒子翻转、单粒子锁定等实验。介绍了SRAM辐射效应测试装置的硬件、软件构成及有关测试技术。利用该装置在激光辐射效应实验装置及HI-13串列加速器上成功地进行了SRAM的辐射效应实验。通过对SRAM芯片电流的检测,断电保护解决了在SRAM实验过程中SRAM芯片的损坏问题。
The equipment for testing SRAM radiation effect is composed by computer and MCU board. The experiment of SRAM Single Event Upset and Single Event Latch up can be made in multi- radiant point. It introduces the hardware, software and concerned testing technology of the equipment. Using the equipment, successfully make SRAM radiation effect experiment in laser testing equipment of radiation effect and HI-13 tandem accelerator. For protection, can cut the power by checking current of SRAM chip; avoid damage of SRAM chip in the experiment.
出处
《核电子学与探测技术》
CAS
CSCD
北大核心
2006年第4期414-416,445,共4页
Nuclear Electronics & Detection Technology
关键词
SRAM
辐射效应
单粒子翻转
单粒子锁定
电流检测
锁定计数
测试装置
SRAM
radiation effect
single event upset
event latch up
electric current detect
event Latch up count
testing equipment
