摘要
为缩短消缺时间、提高消缺效率,智能变电站二次设备的消缺工作通常未深究缺陷产生的根本原因,缺陷处理过程简单、表面,导致缺陷无法彻底消除,使得相同缺陷可能再次发生。因此,为查明缺陷产生的根本原因,将缺陷产生的原因定位到芯片级、原理级,通常需要对缺陷设备开展深层次缺陷查找、分析工作。基于上述原因,对智能变电站二次设备缺陷的验证和试验方法进行了研究,提出了一种缺陷验证和试验技术。
In order to shorten the time of defect elimination and improve the efficiency of defect elimination,the defect elimination of secondary equipment in smart substation usually does not go into seriously the root cause of defects.The defect treatment process is simple and superficial,so that the defects cannot be completely eliminated.Therefore,in order to find out the root cause of defects,the cause of defects is located at the chip level and the principle level,and usually a deep defect detection and analysis for defective equipment is needed.Based on the above reasons,the verification and test methods of defects of secondary equipment in smart substation are studied.A defect verification and testing technique is proposed.
作者
李霞
周文越
朱鑫
丁宣文
Li Xia;Zhou Wenyue;Zhu Xin;Ding Xuanwen(State Grid Chengdu Electric Power Supply Company, Chengdu 610041, Sichuan, China;State Grid Sichuan Electric Power Research Institute, Chengdu 610041, Sichuan, China)
出处
《四川电力技术》
2020年第2期67-69,94,共4页
Sichuan Electric Power Technology
关键词
智能变电站
二次设备
缺陷处理
试验验证
smart substation
secondary equipment
defect treatment
test verification
