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面向终端芯片性能测试技术研究 被引量:2

Research on performance testing of telecommunication terminals and chips
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摘要 介绍了当前业内流行的几种性能测试方法,并着重展示了一种新颖的模拟外场路测(VDT)方法。通过在VDT系统中模拟并重现典型外场环境,如高铁、弱覆盖等,建立完善的场景库,可以更加全面地考察终端在外场环境下的性能表现,贴近用户实际感知,具有良好的发展前景。 With a deep and rapid development of telecommunication industries, it nowadays poses a much higher requirement on the design of terminals and chips, not only focus on throughput or delay, but also a better comprehensive users' experience.It is always one of key issues to telecommunication manufacturers on how to improve the quality of productions through performance testing. In this paper, several commonly used testing technologies are first briefly introduced. Then a novel concept of virtual drive test(VDT) is presented, which is aimed to rebuild the outdoor wireless environment, such as high-speed railway or bad coverage scenarios, in lab based on channel modeling theory. Using VDT system, devices can be tested under different virtual scenarios to simulate what a user experiences in the real world. VDT technology has a bright future but it still faces severe challenges under the forthcoming the fifth generation.
作者 李雷 郑洋
出处 《电信网技术》 2017年第12期57-61,共5页 Telecommunications Network Technology
关键词 性能测试 终端和芯片 模拟外场 performance testing terminals and chips virtual drive test
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