摘要
利用红外光谱法对SF_6设备故障气体中的SiF_4进行定性、定量检测,该方法的线性范围为10～500μL/L,检出限为1μL/L,此方法可以较理想地判断出设备内含硅元素绝缘材料的受损情况。应用于现场SF_6气体绝缘开关类设备的潜伏性故障诊断,验证了分解产物SiF_4对设备内部工况诊断的有效性。
SiF4 was qualitatively and quantitatively analyzed by Fourier transferred infrared spectros- copy. The linear range for the method was 10 -500μL/L, and the detection limit was 1 μL/L. The method was applied in the potential fault diagnosis of SF6 gas insulated switch, and the effectiveness of the SiF4 in the diagnosis of the internal conditions in the equipment was verified.
出处
《分析测试学报》
CAS
CSCD
北大核心
2016年第8期1058-1061,共4页
Journal of Instrumental Analysis
关键词
高压绝缘设备
红外光谱分析
SF6气体分解产物
SiF4检测
high voltage insulation equipment
Fourier infrared spectroscopic analysis
SF6 decom-position product
SiF4 detection
