摘要
分析现有胚胎电子细胞基因存储结构的基础上,考虑基因备份数目对自修复过程的影响,建立了可靠性模型;并根据存储结构的具体实现方式,建立了硬件消耗模型。以可靠性模型和硬件消耗模型为基础,通过分析可靠性、硬件消耗与基因备份数目间的关系,提出了一种基因备份数目优选方法。该方法根据目标电路的可靠性、硬件消耗设计要求,选择兼顾系统可靠性、硬件消耗的基因存储方式、基因备份数目及胚胎电子阵列规模,具有工程应用价值。通过某电路的基因备份数目的选择,对该方法进行了验证。
The existing structures of embryonics cell＇s genome memory were analyzed,and a reliability model was developed considering the effect of the gene backup number on self-repair process. The hardware overhead model was built depending on the implementations of genome memories. Based on the reliability model and hardware overhead model,the relationship among reliability,hardware overhead and gene backup number was analyzed,and a gene backup number selection method was proposed. The genome memory structure,gene backup number and the size of embryonics array,taking into account the system reliability and hardware overhead,can be selected with the proposed method,according to the design requirement of reliability and hardware overhead of target circuit. So the proposed method can be introduced to the engineering application. At last,the method is verified through a circuit＇s gene backup number selection.
出处
《北京航空航天大学学报》
EI
CAS
CSCD
北大核心
2016年第2期328-336,共9页
Journal of Beijing University of Aeronautics and Astronautics
基金
国家自然科学基金(61271153
61372039)~~
