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High performance trench MOS barrier Schottky diode with high-k gate oxide 被引量:2

High performance trench MOS barrier Schottky diode with high-k gate oxide
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摘要 A novel trench MOS barrier Schottky diode(TMBS) device with a high-k material introduced into the gate insulator is reported, which is named high-k TMBS. By simulation with Medici, it is found that the high-k TMBS can have 19.8% lower leakage current while maintaining the same breakdown voltage and forward turn-on voltage compared with the conventional regular trench TMBS. A novel trench MOS barrier Schottky diode(TMBS) device with a high-k material introduced into the gate insulator is reported, which is named high-k TMBS. By simulation with Medici, it is found that the high-k TMBS can have 19.8% lower leakage current while maintaining the same breakdown voltage and forward turn-on voltage compared with the conventional regular trench TMBS.
出处 《Chinese Physics B》 SCIE EI CAS CSCD 2015年第7期426-428,共3页 中国物理B(英文版)
基金 Project supported by the National Basic Research Program of China(Grant No.2011CBA00607) the National Natural Science Foundation of China(Grant Nos.61106089 and 61376097) the Zhejiang Provincial Natural Science Foundation of China(Grant No.LR14F040001)
关键词 trench MOS barrier Schottky diode high-k gate oxide leakage current trench MOS barrier Schottky diode,high-k gate oxide,leakage current
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参考文献11

  • 1Baliga B J 2010 Advanced Power MOSFET Concepts p. vii. 被引量:1
  • 2Juang M H, Yu J and Jang S L 2011 Curr. Appl. Phys. 11 698. 被引量:1
  • 3Baliga B J 1996 IEEE. T. Electron. Dev. 43 1717. 被引量:1
  • 4Mehrotra M and Baliga B J 1995 Solid State Electron. 38 801. 被引量:1
  • 5Merchant S 1999 IEEE. T. Electron. Dev. 46 1264. 被引量:1
  • 6Mahalingam S and Baliga B J 1999 Solid State Electron. 43 1. 被引量:1
  • 7Zhai D Y, Zhao Y, Cai Y F, Shi Y and Zheng Y D 2014 Acta. Phys. Sin. 63 127201 (in Chinese). 被引量:1
  • 8Li W Y, Ru G P, Jiang Y L and Ruan G 2011 Chin. Phys. B 20 087304. 被引量:1
  • 9Medici D-2010.03-0 a 2D Device Simulator TMA Palo Alto USA. 被引量:1
  • 10Mcintyre R J 1966 IEEE. T. Electron. Dev. ED-13 164. 被引量:1

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