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XPS在YAG:Ce^(3+)荧光粉中Ce^(3+)半定量分析方面的应用

Application of XPS in Semi-quantitative Estimation of Ce^(3+) in YAG:Ce^(3+) Phosphor
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摘要 利用XPS测试方法对YAG:Ce3+荧光粉中的Ce3+含量进行了半定量分析,为研究Ce3+含量与YAG:Ce3+荧光粉发光强度的关系,在不同的烧结气氛下制备了一系列YAG:Ce3+荧光粉样品。通过分峰拟合计算可知,在4种不同的制备条件下,Ce3+的相对含量(fCe3+,用Ce3+峰面积与Ce3++Ce4+峰面积之比来估算)分别是88.46%,77.55%,75.33%和68.14%,所对应的烧结气氛依次为CO和N2的混合气氛、CO气氛、N2气氛和空气烧结气氛。YAG:Ce3+荧光粉的发光强度随着Ce3+相对含量的增加有显著增强。 XPS analysis is used to determine the percentage of Ce3+ in YAG.Ce3+ phosphor as a semi quantitative method. In order to confirm the relationship between the luminescence and the percentage of Cea+ more clearly, a series of YAG:Ce3+ phosphors were prepared under different sintering atmospheres. The results indicate that the relative percentages of Ce3+ (fee3+ , estimated as peak area of Ce3+ to Ce3+ + Ce4+ ) are 88.46%, 77.55%, 75.33% and 68.14%, respectively, corresponding to CO + N2 ,CO,N2 and air atmosphere by means of peak separation and fitting. The emission intensity of YAG. Ce3+ increased significantly with increasing Ce3+ concentration.
出处 《华东理工大学学报(自然科学版)》 CAS CSCD 北大核心 2015年第4期484-488,共5页 Journal of East China University of Science and Technology
关键词 YAG:Ce3+荧光粉 半定量分析 发光强度 Ce3+相对含量 XPS YAG: Ce3+ phosphor semi-quantitative estimation luminescence relative percentage of C33+ XPS
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  • 1[1]Thromat N, GautierSoyer M, Bordier G. Formation of the Ce/Y2O3 interface: an in situ XPS study [J]. Surf.Sci. , 1996, 345: 290. 被引量:1
  • 2[2]O'Connell M, Norman A K, Huttermann C F, et al.Catalytic oxidation over lanthanum- transition metal perovskite materials[J]. Catalysis Today, 1999, 47: 123. 被引量:1
  • 3[3]Zhang Zefu, Liu Weimin, Xue Qunji. Study on lubricating mechanisms of La (OH)3 nanocluster modified by compound containing nitrogen in liquid paraffin[J].Wear, 1998, 218: 139. 被引量:1
  • 4[4]Arenas M,A, Garcia I. de Damborenea J. X-ray photoelectron spectroscopy study of the corrosion behaviour of galvanized steel implanted with rare earths[J]. Corrosion Science, 2004, 46: 1033. 被引量:1
  • 5[6]Wang Shengyue, Qiao Zhengping, Wang Wei, et al.XPS studies of nanometer CeO2 thin films deposited by pulse ultrasonic spray pyrolysis[J]. J. Alloys Comp. ,2000, 305: 121. 被引量:1
  • 6[7]Berg C, Raaen S. An X-ray photoemission study of CeRh, Ce-Pd and Ce-Ag interfaces[J]. J. Phys.: Condens. Matter, 1994, 4: 8021. 被引量:1
  • 7[8]Krill G, Kappler J P, Meyer A, et al. Surface and bulk properties of cerium atoms in several cerium intermetallic compounds: XPS and X-ray absorption measurements[J]. J. Phys. F: Metal Phys. , 1981, 11: 1713. 被引量:1
  • 8[9]Bear Y, Ott H R, Fuggle J C, et al. Photoelectron and bremsstrahlung -isochromat studies of 4f levels in γ-Ce,Ce-A13, CeSn3 and CePd3 [J]. Phys. Rev. B, 1981,24(9): 5384. 被引量:1
  • 9[10]Mullins D R, Overbury S H, Huntley D R. Electron spectroscopy of the single crystal and polycrystalline cerium oxide surfaces [J]. Surf. Sci. , 1998, 409: 307. 被引量:1
  • 10[11]Rao C N R, Sarmat D D, Sarode P R, et al. XPS and X-ray absorption edges studies of the surface and bulk valence states of cerium in CeCO2[J]. J. Phys. C:Solid State Phys., 1981, 14:L451 被引量:1

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