摘要
相变存储器单元的测试主要包括set、reset和read操作,目前国内外多采用施加电压脉冲的方法对相变存储单元进行reset操作,这不仅容易造成器件的损坏,而且使得相变过程中瞬态电流的准确计算非常困难。与常规测试方法不同,文章提出一种专门针对相变存储器的电流脉冲测试系统,该系统可以提供准确可控的电流脉冲来对相变存储器器件单元进行操作。
Tests for phase change memory （PCM） device unit mainly includes set, reset and read. Traditional test systems usually apply voltage pulses to do reset operation on phase change memory, but this measurement method not only easily results in damage to the devices, but also makes it very difficult to measure the transient current. Unlike the conventional test methods, a current pulse test system for PCM device unit is introduced in this work and the system can supply precise and controllable current pulses to operate PCM.
出处
《半导体光电》
CAS
CSCD
北大核心
2014年第1期136-138,143,共4页
Semiconductor Optoelectronics
基金
国家"973"计划项目(2011CB9328004
2010CB934300
2011CBA00607)
国家集成电路重大专项项目(2009ZX02023-003)
国家自然科学基金项目(60906004
60906003
61006087
61076121
61176122
61106001)
上海市科委项目(11DZ2261000
1052nm07000
11QA1407800)
中国科学院资助项目(20110490761)
