期刊文献+

不同叠层结构印制电路板散热性能研究 被引量:5

Thermal dissipation analysis of printed circuit boards with different laminating structures
原文传递
导出
摘要 运用有限元数值分析法对三种PCB散热结构,分别是芯片下方的PCB中埋置铜块(PCB-Ⅱ型)、PCB底部压合铜板(PCB-Ⅲ型)、PCB中间加入导热铝层(PCB-Ⅳ型)进行稳态、瞬态热分析、热阻分析以及不同对流系数下的热分析,并与不经过散热处理的PCB参照组(PCB-Ⅰ型)进行对比。结果显示:在稳态和瞬态热分析中,Ⅱ型、Ⅲ型、Ⅳ型较参照组PCB-Ⅰ型板面最高温度分别降低了3.22,9.66,7.86℃,其中Ⅲ型升温幅度最平缓,Ⅱ型与Ⅲ型在10~30s温度差距小,在30s后逐渐拉大;在改变对流系数时,Ⅲ型散热效果最好,而Ⅱ型随着对流系数增加散热效果趋近于Ⅳ型。 Three structures of PCB heat dissipations including the embedment of copper block under the chip (PCB-Ⅱ), conjunction of the copper plate on the bottom (PCB-Ⅲ) and the addition of Al plate (PCB-Ⅳ) were carried out FEM numerical analysis, including steady-state analysis, transient thermal analysis, heat resistance analysis and thermal analysis under different air heat convection coefficients, and compared to the common PCB(PCB-Ⅰ)without effective heat treatment. The results indicate that PCB with three kinds of heat dissipation structures as PCB-Ⅱ, PCB-Ⅲ and PCB-Ⅳ successfully reduce maximum temperatures by 3.22, 9.66, 7.86 ℃ compared to the reference group PCB-Ⅰ in the steady-state and transient thermal analyses. The temperature variation of PCB-Ⅲ structure is the flattest among four kinds of PCB structures The temperature gap between PCB-Ⅱ and PCB-Ⅲ is little within 10 s to 30 s and widen after 30 s. Heat dissipation effect of PCB-Ⅲ is the best after the variation of convection coefficients, while the thermal dissipation effect of PCB-Ⅱ tends to PCB-Ⅳ with the convection coefficient increase.
出处 《电子元件与材料》 CAS CSCD 北大核心 2014年第1期43-47,共5页 Electronic Components And Materials
基金 2012年广东省教育部产学研结合重大专项资助项目(No.2012A09030007)
关键词 PCB 散热 埋入式 导热系数 有限元分析 对流系数 PCB thermal dissipation embed thermal conductivity FEM analysis convection coefficient
  • 相关文献

参考文献10

  • 1NARENDRAN N,GUY. Life of LED-based white light sources[J].Disp Technol,2005,(01):167-171. 被引量:1
  • 2NARENDRAN N,GUY P,FREYSSINIER J. Solid-state lighting:failure analysis of white LEDs[J].{H}Journal of Crystal Growth,2004,(3/4):449-456. 被引量:1
  • 3ZOU Q B,MIAO Y B,CHEN Y. Micro-assembled multi-chamber thermal cycler for low-cost reaction chip thermal multiplexing[J].Sens Actuators A:Phys,2002,(1/2):114-121. 被引量:1
  • 4ZHAO Z. Thermal design of a broadband communication system with detailed modeling of TBGA packages[J].{H}Microelectronics Reliability,2003,(05):785-793.doi:10.1016/S0026-2714(03)00029-5. 被引量:1
  • 5FAN X J,HAQUE S. A micro-mechanics approach in polymeric material failures in microelectronic packaging[A].San Diego,USA:Conference Organizer,2002. 被引量:1
  • 6CHO S H. Heat dissipation effect of Al plate embedded substrate in network system[J].{H}Microelectronics Reliability,2008,(10):1696-1702. 被引量:1
  • 7夏雅军.传热学[M]{H}北京:中国电力出版社,2000203-224. 被引量:1
  • 8崔海坡,邓登,程恩清.同一PCB板上不同封装结构的热应力分析[J].电子元件与材料,2013,32(2):58-61. 被引量:7
  • 9叶修梓.Solid Works Simulation高级教程[M]{H}北京:机械工业出版社,2007327-335. 被引量:1
  • 10刘绪磊,周德俭,黄春跃,李永利.基于正交试验的板级电路模块热分析[J].电子元件与材料,2009,28(5):43-46. 被引量:5

二级参考文献15

  • 1李天明,黄春跃.基于ANSYS的板级电路模块热分析[J].桂林电子工业学院学报,2006,26(1):40-44. 被引量:7
  • 2于慈远.计算机辅助电子设各热分析、热设计及热测量技术的研究[R].北京:北京航空航天大学,2000. 被引量:1
  • 3US Dept Defense. MIL-HDBK-217B Reliability prediction of electronic equipment [S]. USA: US Dept Defense, 1974. 被引量:1
  • 4李景湧.有限元法[M].北京:北京邮电大学出版社,1999.30-43. 被引量:18
  • 5秦向南,杨平,沈才俊,廖宁波.多芯片组件的热三维有限元模拟与分析[J].电子元件与材料,2007,26(9):10-13. 被引量:7
  • 6CHAWLA N. Thermal fatigue behavior of Sn-rich(Pb-free)solders[J].Metallurgical and Materials Transactions A:Physical Metallurgy and Materials Science,2008.799-810. 被引量:1
  • 7UBACHS R,SCHREURS P,GEERS M. Elasto-viscoplastic nonlocal damage modeling of thermal fatigue in anisotropic lead-free solder[J].Mechanics of Materials,2007,(07):685-701.doi:10.1016/j.mechmat.2006.11.001. 被引量:1
  • 8VANDEVELDE B,DEGRYSE D,BEYNE E. Modified micro macro thermo-mechanical modeling of ceramic ball grid array packages[J].Microelectronics Reliability,2003,(02):307-318. 被引量:1
  • 9LEE T,LEE J,JUNG L. Finite element analysis for solder ball failures in chip scale package[J].Microelectronics Reliability,1998,(12):1941-1947. 被引量:1
  • 10李长庚,林丹华,周孑民.PBGA封装热可靠性分析[J].电子元件与材料,2008,27(1):65-68. 被引量:13

共引文献9

同被引文献28

引证文献5

二级引证文献2

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部