摘要
与集成电路(ASIC)性能日益强大、制造成本日益低廉相反,测试成本在不断增加,传统的测试技术已经不能满足高速、多时钟SOC芯片的测试要求,开发新的测试技术、降低测试成本已经成为必然。提出了一种软件自测试方法,它利用被测芯片的处理器核资源,通过执行测试程序来完成芯片的自我诊断。该方法可以实现芯片全速(At-Speed)测试,有效降低对高速、昂贵测试资源的依赖,可广泛应用于故障定位精度要求不高的测试过程中。最后,使用该自测试方法,在低成本测试机上实现了一款高性能音频SOC芯片测试。
In contrast with stronger ASIC function and cheaper production cost,test cost is on the increase.Traditional test technique doesn＇t meet the test request of high speed and multi clock SOC.It is inevitable to develop new test technique and reduce test cost.This paper presents a Soft-Based Self-Testing（SBST） method,it uses the embedded processor core of the Device-Under-Test（DUT）,completes the self diagnose of chip by executing test program.This method can apply at-speed test while alleviating the need for high-speed testers.It can be applied in test process for low resolution fault location.Finally,the SBST method demonstrates successful application to an audio SOC.
出处
《微处理机》
2011年第4期12-15,20,共5页
Microprocessors
关键词
软件自测试
功能测试
测试
Software-Based-Self-Testing
Function-Testing
Test
