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Ge/Si量子点生长的研究进展 被引量:1

Advance in the Growth of Ge/Si Quantum Dots
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摘要 回顾了近年来在Ge/Si量子点生长方面的研究进展。主要讨论了为了提高量子点空间分布有序性、增大量子点的密度、减小量子点的尺寸及改善其分布均匀性而采取的各种方法,如图形衬底辅助生长、表面原子掺杂及利用超薄SiO2层辅助生长等,以及Ge量子点的演变及组分变化。 Recent progress in the growth of the Ge/Si quantum dots is reviewed. Various approaches currently investigated to grow Ge/Si quantum dots with high uniformity, high density and small size are reviewed in detail, such as patterned substrate assisted growth, doping atoms on the surface and ultra-thin SiO2 films assisted growth. In addi- tion, the evolution and composition of the Ge dots are also well discussed.
出处 《材料导报》 EI CAS CSCD 北大核心 2010年第19期117-122,共6页 Materials Reports
基金 国家自然科学基金(10964016) 云南省自然基金重点项目(2008CC012) 教育部科学技术研究重点项目
关键词 Ge/Si量子点生长 图形衬底 表面原子掺杂 超薄SiO2层 Ge组分 growth of Ge/Si quantum dots, pattered substrate, doping atoms on surface, ultra-thin SiO2 films, Ge composition
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