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平行度测试仪原理及其测量精度分析 被引量:22

Theory and precision analysis of testing apparatus of parallel depth
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摘要 平行度测试仪是检测大型光电经纬仪多光轴系统平行度的设备,要求平行度测试仪的精度要达到0.5″。方法是利用一块反射镜和两块五棱镜将一束准直光束分光成两束平行光束,大型经纬仪的两个光学系统分别接收这两束平行光,两束平行光所成像的脱靶量差值即为两光学系统的光轴平行度。利用两个精度为0.1″的自准直平行光管和一块平面反射镜检测平行度测试仪精度。经检测标定后平行度测试仪的精度可达到0.5″,能够很好的满足检测平行度为2″的光学系统的检测。 Parallelization tester is used to test the parallel degree of multi-optic-axes system of the large scale photoelectric theodolite with precision less than 0.5 arcsec. By using a reflector and two pentaprisms, one beam of light is separated into two parallel beams, then respectively they are received by two optical systems of the large scale photoelectric theodolite with certain'imaging D-value which correspondingly represents each optic axis parallel error of these two optical systems. With two autocollimations and a big flat mirror, the precision of the parallelization tester can be better evaluated. After experimentally measuring and marking, this instrument's precision reaches 0.5 arcsec, which better satisfies the requirement-normally 2 arcsec the parallel precision of optical system testing.
出处 《光电工程》 EI CAS CSCD 北大核心 2007年第5期52-56,共5页 Opto-Electronic Engineering
关键词 平行度检测 五棱镜 光电测量系统 光轴平行度 Parallel testing Pentaprism Large scale photoelectric theodolite Optic axis parallel.
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