摘要
利用渐近分析方法研究在小的远场来流扰动作用下纯熔体内具有液固平直界面的凝固过程的稳定性,导出了液固界面的扰动振幅变化率与波数的色散关系,以此为基础给出了具有液固平直界面的凝固过程的稳定性判据,揭示了金属凝固过程中液固平直界面转变为胞晶界面的内在机理.
The stability of a planar liquid/solid interface of solidification in pure melt under perturbation of a small far-field flow was studied by using asymptotic analysis. A dispersion relation between the wave number and perturbation amplification rate was derived, and the morphological stability of planar liquid-solid interface of solidification was determined. The results reveal the mechanism of the transition from planar interface to cellular interface in directional solidification.
出处
《北京科技大学学报》
EI
CAS
CSCD
北大核心
2006年第8期728-732,共5页
Journal of University of Science and Technology Beijing
基金
国家重大基础研究项目(No.G2000067206-1)
关键词
熔体
晶体生长
液固界面
平直界面
渐近分析
melt
crystal growth
liquid/solid interface
planar interface
asymptotic analysis
