摘要
ZT值、最大制冷温差和响应时间是表征半导体制冷器性能的重要参数.文中介绍了一种能同时测量这三个参数的瞬态方法,并讨论了热沉对测试结果的影响.利用一个由恒流脉冲发生器和数据采集卡组成的简单测试系统测得制冷器在小电流下的电阻电压和塞贝克电压,通过这两个电压推导出ZT值、最大制冷温差.这种瞬态方法是非接触式测量,准确度高,可用于薄膜热电器件测试;另外瞬态方法耗时短,可大大缩短半导体制冷器可靠性测试的周期.采用这种方法对4mm×4mm×2·4mm的热电制冷器进行实验,环境温度300K时,测得ZT值为0·39,最大温差58·5K,响应时间20s.
The figure of merit ZT, maximum temperature difference,and response time are important parameters for thermoelectric coolers. A transient method for testing these parameters is introduced, and the effect of the heat sink is also discussed, The resistance and Seebeck voltages used to calculate the ZT and the maximum temperature difference are measured using a testing system composed of a DC pulse generator and a DAQ card, The transient method is simple and accurate, and can he used to test thin film thermoelectric coolers. In addition, this method spends very little time. Thus, it can shorten the reliability test period for thermoelectric coolers. A 4mm × 4mm × 2.4mm commercial thermoelectric cooler is tested using this method. A figure of merit ZT of 0. 39 , maximum temperature difference of 58. 5K,and response time of 20s is measured.
基金
国家重点基础研究发展规划(批准号:2006CB300404)
国家自然科学基金(批准号:50276011
50275026)
江苏省自然科学基金(批准号:BK2005063)资助项目~~
