摘要
本文简要介绍了基于虚拟仪器图形化语言LabVIEW开发的薄片厚度检测系统。系统采用高精度非接触式电容传感器进行前端数据采集,在计算机控制下实现了对直径150mm内,厚度在0.09～1.00mm之间的非金属薄片的单点静态检测,和圆周、直径方向的动态快速检测。在显示屏直角坐标下显示薄片面积上的厚度分布曲线,给出被检薄片厚度参数并用语音方式报数,实现了LabVIEW环境下大量检测数据的数据库管理,对不合格的薄片自动进行声光报警。
Slice thickness-testing system based on Virtual Instrument graphic language LabVIEW is introduced in this paper.Data is collected by non-contact capacitance sensor.Under PC controlled,non-metallic slice that diameter is within 150mm,thickness is between 0.09mm and 1.00mm are tested quickly.Methods of testing include static test of single dot and dynamic test of directions diameter and circle.Parameters of slice thickness are given and read by sounding. Database management of testing data and alarming of sound and flashing to fatal slice are achieved.
出处
《工业控制计算机》
2005年第1期15-16,共2页
Industrial Control Computer
