期刊文献+

挠性电路板化学镍钯金工艺技术研究 被引量:6

Process technology research of FPC ENEPIG
下载PDF
导出
摘要 主要对化学镍钯金表面处理工艺原理进行介绍,通过挠性电路板化学镍钯金后引线健合能力、可焊性、抗老化等一系列可靠性测试,验证其相对其它表面处理技术更加优越,特别适用于表面贴装混合组装板等要求高连接可靠性的产品上,并且满足无铅组装工艺所有需求,非常适合挠性板、封装基板等的表面处理PCB制造。 This article mainly introduced the reference process principle of ENEPIG surface treatment technology, through the FPC board after ENEPIG bonding ability, weldability, aging resistance and a series of reliability test, veriifcation of its more superior than other surface treatment technology, especially suitable for SMT mixed assembling plate for high connection reliability of products, and meet the demand of all lead free assembly process, very suitable for FPC board, packing substrate surface treatment of PCB manufacturing.
出处 《印制电路信息》 2013年第S1期327-334,共8页 Printed Circuit Information
关键词 表面处理 化镍钯金 可焊性测试 引线键合能力 抗老化能力 Surface Treatment ENEPIG Weldability Test Bonding Ability The Anti-Aging Ability
  • 相关文献

参考文献3

二级参考文献16

  • 1王旭艳,薛松柏,禹胜林,朱小军.温度与镀层对Sn-Ag-Cu无铅钎料润湿性的影响[J].焊接学报,2005,26(10):93-96. 被引量:12
  • 2Li G Y, Chan Y C. Aging effects on shear fatigue life and shear strength of soldered thick film joints [ J ]. IEEE Trans-action on Components, Packaging and Manufacturing Technologies-Part B, 1998,21 (4) :398-405. 被引量:1
  • 3Ahmed Sharif, Chan Y C. Comparative study of interracial reactions of Sn-Ag-Cu and Sn-Ag solders on Cu pads during reflow soldering[ J]. Journal of Electronic Materials,2005,34( 1 ) :98-102. 被引量:1
  • 4Laurila T, Vuorinen V, Kivilahti J K. Interracial reactions between lead-free solders and common base materials [ J ]. Materials Science and Engineering R ,2005,49 ( 1-2 ) : 1-60. 被引量:1
  • 5Liu X J , Wang C P, Gao F,et al. Thermodynamic calculation of phase equilibria in the Sn-Ag-Cu-Ni-Au system [ J]. Journal of Electronic Materials ,2007,36 ( l I ) :75 -79. 被引量:1
  • 6Arulvanan P,Zhong Z W, Shi X Q. Effects of process conditions on reliability, microstructure evolution and failure modes of SnAgCu solder joints[ J]. Microelectronics Reliability,2006,46:432-439. 被引量:1
  • 7Zou Hefei, Zhu Qingsheng, Zhang Zhefeng. Growth kinetics of intermetallic compounds and tensile properties of Sn-Ag-Cu/Ag single crystal joint [ J ]. Journal of Alloys and Compounds,2008,461 (1-2) :410-417. 被引量:1
  • 8Hsiung C K, Chang C A, Lai J J, et al. Solder bump oxida-tion prevention by fabricating thermal oxidation barrier layer ofwafer level process [ C ] //International Mierosystems, Paekag-ing , Assembly and Circuits Technology Conference (IMPACT) Taipei ,2007 :326-328. 被引量:1
  • 9Jong W R, Tsai H C, Chang temperaturecyclic loading on lead-free scale pack-age by Taguchi method H T, et al. The effects of solder joints of wafer level chip [ J ]. Journal of Electronic.Packaging,2008,130 ( 3 ) : 1-10. 被引量:1
  • 10Chetanov A N.Research on effect of soldering temperature and time on intensity of Sn-Ag-Cu (In) solder without plumbum[C]∥第七届国际测试技术研讨会论文集.2007:235-237. 被引量:1

共引文献10

同被引文献50

引证文献6

二级引证文献20

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部