We have deposited W/Si multilayer mirrors using the magnetron sputtering under the low sputtering pressure and the high magnetic field strength,and measured their reflectivtity in Beijing synchrotron radiation facilt...We have deposited W/Si multilayer mirrors using the magnetron sputtering under the low sputtering pressure and the high magnetic field strength,and measured their reflectivtity in Beijing synchrotron radiation faciltiy,W/Si multilayer show the peak reflectivity of approximately 10% at a photon energy of 1200eV and 10.5% at a photoenergy of 700eV respectively at the incidence angle of 81°。展开更多
The melts of a series of low molecular weight poly（ethylene oxide）（PEO） fractions on mica surfaces were studied by atomic force microscopy（AFM） and X-ray reflectivity（XRR） measurement.The PEO ultrathin films w...The melts of a series of low molecular weight poly（ethylene oxide）（PEO） fractions on mica surfaces were studied by atomic force microscopy（AFM） and X-ray reflectivity（XRR） measurement.The PEO ultrathin films were obtained via static dilute solution casting.Different from the melts of the PEO with both methoxyl（（—OCH3）） end groups that are dewetted on the mica surface,a pseudo-dewetting phenomenon of the PEO melts was observed when either one end group of the PEOs becomes hydroxyl（—OH） or both are hydroxyl groups.The wetting layer thicknesses of the pseudo-dewetted melts were measured to be 4.5～4.7 nm,independent on the molecular weight and the end groups of PEOs.However,the PEO melt droplets on the wetting layer varied from spherical caps with relatively high contact angle to irregular shapes with relatively low contact angle when increasing the molecular weight and the hydrophobicity of end groups of PEOs.展开更多
文摘We have deposited W/Si multilayer mirrors using the magnetron sputtering under the low sputtering pressure and the high magnetic field strength,and measured their reflectivtity in Beijing synchrotron radiation faciltiy,W/Si multilayer show the peak reflectivity of approximately 10% at a photon energy of 1200eV and 10.5% at a photoenergy of 700eV respectively at the incidence angle of 81°。
文摘The melts of a series of low molecular weight poly（ethylene oxide）（PEO） fractions on mica surfaces were studied by atomic force microscopy（AFM） and X-ray reflectivity（XRR） measurement.The PEO ultrathin films were obtained via static dilute solution casting.Different from the melts of the PEO with both methoxyl（（—OCH3）） end groups that are dewetted on the mica surface,a pseudo-dewetting phenomenon of the PEO melts was observed when either one end group of the PEOs becomes hydroxyl（—OH） or both are hydroxyl groups.The wetting layer thicknesses of the pseudo-dewetted melts were measured to be 4.5～4.7 nm,independent on the molecular weight and the end groups of PEOs.However,the PEO melt droplets on the wetting layer varied from spherical caps with relatively high contact angle to irregular shapes with relatively low contact angle when increasing the molecular weight and the hydrophobicity of end groups of PEOs.
