摘要
介绍了国家同步辐射实验室二期工程X射线衍射和散射光束线实验站的建设与主要设备.利用设备采用X射线反射法,在不破坏样品的情况下得到了Si/C多层膜的结构信息;通过对标准Si粉末样品的FWHM测试表明该站可进行粉末全谱扫描;利用X射线掠入射衍射技术分析了ZnO薄膜的生长条件与结构的关系;采用X射线散斑方法直接观测了弛豫铁电体内部的纳米空间尺度的电极化团簇的空间时间构造.
As a science platform for universities and research organizations in China, construction of the UTB beamline and the main equipment of the X-ray diffraction and diffuse scattering station at National Synchrotron Radiation Laboratory （NSRL） were introduced. Using the X-ray reflectivity, the structure information of Si/C 20 multilayers sample was gotten. Through the rocking curve of standard Si powder sample, the powder diffraction was performed. Using the grazing incidence X-ray diffraction, the relation of ZnO thin film between the growth condition and structure was analyzed. Through the X-ray speckle method, the microscopic-scale structures for relaxor ferroelectrics in a high external dc field during phase transition was observed directly.
基金
国家自然科学基金(10490192
10174069)资助
关键词
同步辐射应用
X射线反射
X射线衍射
X射线掠入射衍射
synchrotron application
X-ray reflectivity
X-ray diffraction
X-ray grazing-incidence diffraction
