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TFR模型序加试验下WEIBULL分布产品寿命的统计分析 被引量：12

Statistical Analysis of Weibull Distribution for Tampered Failure Rate Model in Progressive Stress Accelerated Life Testing
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摘要 本文针对损伤效率(TFR)模型,首次提出将步加试验推广至序加试验,给出了两参数Weibull分布参数的极大似然估计。 In this paper, the tampered failure rate(TFR) model is generalized from the step-stress accelerated life testing to the progressive stress accelerated life testing for the first time.Furthermore, we derive the maximum likelihood estimation for two-parameter Weibull distribution
作者 王蓉华 费鹤良
机构地区 上海师范大学数学科学学院
出处 《运筹与管理》 CSCD 2004年第2期39-44,共6页 Operations Research and Management Science
基金 国家自然科学基金资助项目(10271079 69971016) 上海市教委重点学科基金资助项目。
关键词 损伤效率模型 WEIBULL分布 残存函数 序进应力加速寿命试验 极大似然估计 产品寿命 tampered failure rate model Weibull distribution survival function progressive stress accelerated life test maximum likelihood estimation
分类号 O212 [理学—概率论与数理统计]
  • 相关文献

参考文献11

  • 1Bhattacharyya G K, Soejoeti Z. A Tampered Failure Rate Model for Step-Stress Accelerated Life Test[J ]. Commun. Statist-Theory Meth,1989,18(5) : 1627-1643. 被引量：1
  • 2Madi M T. Multiple Step-Stress Accelerated Life Test: The Tampered Failure Rate Model[J]. Commun. Statist-Theory Meth, 1993,22(9):2631-2639. 被引量：1
  • 3Seiji Nabeya. Coincidence of Two Failure Rate Models[J]. Commun. Statist-Theory Meth, 1993,22(3) :781-785. 被引量：1
  • 4Rao Raja B. Equivalence of the Tampered Random Variable and the Tampered Failure Rate Models in Accelerated Life Testing for a Class of Life Distributions Having the ‘Setting the Clock Back to Zero Property' [J]. Commun. Statist-Theory Meth, 1992,21(3) :647-664. 被引量：1
  • 5Lin Z, Fei H. Statistical Inferenee from Progressive Stress Accelerated Life Tests[A]. Proceedinga of China-Japan Reliability Symposium[C].Shanghai, 1987,229-236. 被引量：1
  • 6Fei H, Xun X. Statical Analysis for Progressive Stress Accelerated Life Testing in the Exponential Caes[A]. ICRMS'96. Guangzhou, China.No5. 12-15. Proceedings of the Third International Conference on R. Maintainability and Safety[ C]. Publishing House of Electronics Industry:420-425. 被引量：1
  • 7DeGroot M H, Goel P K. Bayesian estimation and optimal designs in partially accelerated life testing[J]. Naval Research Logistics Quarterly,1979,26:223-235. 被引量：1
  • 8Nelson W. Accelerated life testing step-stress models and data analysis[J]. IEEE Trans. on Reliability. 1980,29:103-108. 被引量：1
  • 9Nelson W. Accelerated Testing[M]. New York:John Wiley & Sons, 1990. 被引量：1
  • 10Wang R, Fei H. Uniqueness of the Maximum Likelihood Estimate of the Weibull Distribution Tampered Failure Rate Model[J]. Commun Statist-Theory, 2003,32(12) :2321-2339. 被引量：1

二级参考文献12

  • 1汤银才.Weibull分布序进应力加速寿命试验中参数的最小二乘估计[J].上海师范大学学报,1994,23:90-96. 被引量：3
  • 2Bhattacharyya G K, Soejoeti Z.A Tampered Failure Rate Model for Step-Stress Accelerated Life Tesl[J]. Commun Statist-Theory Mety., 1989, 18(5):1627-1643. 被引量：1
  • 3Madi M T. Multiple Step-Stress Accelerated Life Test: The Tampered Failure Rate Model[J]. Commun Statist-Theory Meth., 1993, 22(9):2631-2639. 被引量：1
  • 4Seiji Nabeya. Coincidence of Two Failure Rate Models[J]. Commun. Statist-Theory Meth., 1993,22(3):781-785. 被引量：1
  • 5Rao, Raja B. Equivalence of the Tampered Random Variable and the Tampered Failure Rate Models in Accelerated Life Testing for a Class of Life Distributions Having the `Setting the Clock Back to Zero Property'[J]. Commun. Statist. Theory Meth., 1992,21(3):647-664. 被引量：1
  • 6Lin Z, Fei H. Statistical Inference from Progressive Stress Accelerated Life Tests[A]. Proceedings of China-Japan Reliability Symposium[C]. Shanghai, 1987:229-236. 被引量：1
  • 7Fei H., Xun X. Statistical Analysis for Progressive Stress Accelerated Life Testing in the Exponential Case[A]. ICRMS'96. Guangzhou, China. No5. 12-15. Proceedings of the Third International Conference on R. Maintainability and safety[C]. Publishing House of Electronics Industry:420-425. 被引量：1
  • 8DeGroot M H, Goel P K. Bayesian estimation and optimal Designs in partially accelerated life testing[J]. Naval Research Logistics Quarterly, 1979, 26: 223-235. 被引量：1
  • 9Nelson W. Accelerated life testing step-stress models and data analysis[J]. IEEE Traus. on Reliability, 1980, V.29: 103-108. 被引量：1
  • 10Nelson W Accelerated Testing[M]. New York: John Wiley & Sons, 1990. 被引量：1

共引文献15

同被引文献44

引证文献12

二级引证文献9

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2004年 第2期

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