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Vibration Compensation for Scanning Tunneling Microscope 被引量:1

Vibration Compensation for Scanning Tunneling Microscope
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摘要 The influence of vibration is already one of main obstacles for improving the nano measuring accuracy.The techniques of anti-vibration,vibration isolation and vibration compensation become an important branch in nano measuring field.Starting with the research of sensitivity to vibration of scanning tunneling microscope(STM),the theory,techniques and realization methods of nano vibration sensor based on tunnel effect are initially investigated,followed by developing the experimental devices.The experiments of the vibration detection and vibration compensation are carried out.The experimental results show that vibration sensor based on tunnel effect is characterized by high sensitivity,good frequency characteristic and the same vibratory response characteristic consistent with STM. The influence of vibration is already one of main obstacles for improving the nano measuring accuracy.The techniques of anti-vibration,vibration isolation and vibration compensation become an important branch in nano measuring field.Starting with the research of sensitivity to vibration of scanning tunneling microscope(STM),the theory,techniques and realization methods of nano vibration sensor based on tunnel effect are initially investigated,followed by developing the experimental devices.The experiments of the vibration detection and vibration compensation are carried out.The experimental results show that vibration sensor based on tunnel effect is characterized by high sensitivity,good frequency characteristic and the same vibratory response characteristic consistent with STM.
出处 《Semiconductor Photonics and Technology》 CAS 2003年第4期230-233,共4页 半导体光子学与技术(英文版)
基金 KeyTechnologyProjectofTianjinCity (0 0 310 86 11)
关键词 Nano vibration sensor Scanning tunneling microscope(STM) Tunnel effect Vibration compensation 振动传感器 扫描隧道电子显显镜 隧道效应 振动补偿
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  • 1[1]BAI Chun-li.Scanning Tunneling Micro-technology and Application[M]. Shanghai:Shanghai Science and Technology Press,1992(in Chinese). 被引量:1
  • 2[2]SHI Yuan.Vibration Measurement and Analysis[M].Shanghai:Tongji University Press,1990.21-22(in Chinese). 被引量:1
  • 3[3]Binning G,Rohrer H. Surface studies by scanning tunneling microscopy[J]. Phys.Rev.Lett.,1982,(49):57-61. 被引量:1

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