摘要
针对国家标准法检测小麦粉品质的传统方法存在一定缺陷,提出基于近红外光谱和中红外光谱技术快速检测面粉的方法,并基于偏最小二乘法建立了矫正模型,对小麦粉的灰分、水分、面筋品质指标进行了分析。对于小麦粉的掺杂鉴别问题,基于标准法测光谱距离建立了聚类分析模型,结果表明,可实现对小麦面粉品质的快速检测及掺杂鉴别。
A rapid method for the identification of wheat flour adulteration using near- and mid-infrared(NIR-MIR) spectroscopy was proposed to overcome the shortcomings of the conventional method described in the Chinese national standard. A calibration model was established using partial least squares regression analysis, and chemical analysis of wheat flour was performed for ash, moisture and gluten. Moreover, a clustering analysis model was developed based on the spectral distances measured by the standardized method to identify wheat flour adulteration. Our experimental results confirm that this NIR-MIR spectroscopic method permits the rapid identification of wheat flour adulteration.
出处
《食品科学》
EI
CAS
CSCD
北大核心
2014年第12期128-132,共5页
Food Science
基金
北京市教委科技计划重点项目(KZ201310011012)
关键词
小麦粉
近红外光谱
中红外光谱
偏最小二乘法
聚类分析
wheat flour
near-infrared spectroscopy
mid-infrared spectroscopy
partial least squares
cluster analysis
