摘要
The SEM and AFM images of three TiO2 nano-films prepared at different conditions were obtained and transformed into digital format. The multifractal analyses for three films were made using height from a depth of thickness of film B and q from 55 to -55. The scale- invariance is very good for all lncq(e)~lne plots and t(q)~q plots at least close to three orders of magnitude. But the multifractal spectra f(a) of the films are quite distinct due to their different height distribution.
The SEM and AFM images of three TiO2 nano-films prepared at different conditions were obtained and transformed into digital format. The multifractal analyses for three films were made using height from a depth of thickness of film B and q from 55 to -55. The scale- invariance is very good for all lncq(e)~lne plots and t(q)~q plots at least close to three orders of magnitude. But the multifractal spectra f(a) of the films are quite distinct due to their different height distribution.
