摘要
针对当前方法进行电子显微镜图像畸变校正时,存着图像校正误差较大、完成时间过长,能量消耗较大等问题。提出基于双粒子群优化算法的图像畸变快速校正方法。通过对透射电子显微镜图像畸变进行分析,获取显微镜图像畸变前和和畸变后坐标之间对应关系,将其对应关系进行多项式变换,求出多项式拟合后最小误差,获取电子显微镜畸变测度,采用电子显微镜图像固定惯性权重,以立方映射混沌因子对过程中不动的粒子进行扰动,采用电子显微镜图像自适应的惯性权重,以适应度值来对惯性权重大小进行调节,以两种方法过程中的最优粒子作为全局最优解,完成图像畸变快速校正。实验结果表明,所提方法在进行图像畸变校正时误差较小、完成时间较短、能量消耗较小。
In this paper, a method to rapidly correct image distortion based on double particle swarm optimization was proposed. By analyzing the image distortion of transmission electron microscope, the corresponding relationship between coordinates of microscope image before and after the distortion was obtained, the polynomial transformation was conducted on this corresponding relationship, and then the minimum error after the polynomial fitting was found. Meanwhile, the measure of electron microscope distortion was obtained. In addition, the electron microscope image was used to fix the inertial weight and the motionless particle was perturbed by the cubic mapping chaotic factor. Moreover, the adaptive inertia weight of electron microscope image was used to adjust the inertia weight with the fitness value. The optimal particle in two methods was used as the global optimal solution. Thus, we completed the rapid correction of image distortion. Simulation results show that the proposed method has less error, shorter completion time and less energy consumption during image distortion correction.
作者
温宏愿
刘小军
张朋
WEN Hong-yuan;LIU Xiao-jun;ZHANG Peng(Taizhou Institute of Science and Technology Nanjing University of Science and Technology,Jiang su Taizhou 225300,China)
出处
《计算机仿真》
北大核心
2019年第2期431-434,共4页
Computer Simulation
基金
泰州市科技支撑计划(农业)项目(TN201610)
江苏省"333工程"科研资助项目(BRA2016177)
江苏省高校"青蓝工程"人才项目(2016-2019)
关键词
显微镜
图像畸变
快速校正
Microscopy
Image distortion
Fast correction
