摘要
用扫描电子显微镜和X射线能谱仪测定了低能V+ 注入干花生种子的穿透深度 浓度分布。结果表明 :这种分布是有长拖尾的高斯分布 ;2 0 0keV的V+ 注入干花生种子的最大穿透深度为 1 3 6 μm。比较了实验结果与TRIM95的计算值。
The penetration depth and concentration distribution for vanadium ions with low energy implanted into the dry peanut seeds is determined by scanning electron microscope and X-ray energy dispersion spectrometer. The results show that the depth-concentration distribution is a Gaussian distribution with a long tail and the maximum penetration depth is about 13.6 μm for V+ 200 keV in cotyledon of the peanut. The experimental result of the implanted V+ ranging in the peanut seed is compared with the calculating value of the TRIM95.
出处
《原子能科学技术》
EI
CAS
CSCD
2002年第6期531-534,共4页
Atomic Energy Science and Technology
基金
国家自然科学基金资助项目 (19890 30 3)
