摘要
物质材料的光子质量衰减系数的准确值可为不同领域提供基本数据。由于单能X射线辐射装置能量连续可调、光子数可测,产生的X射线单能窄束,使其成为研究质量衰减系数(μ/ρ)的理想器件。研究了在8~20 keV能量范围内,Zn样品在K吸收边附近(9~11 keV),以0.1 keV步长,基于单能X射线装置的质量衰减系数测量方法,并利用实验得到的测量值与NIST理论值进行比较分析。结果表明,在K吸收边跳跃附近会产生1个最大偏差,偏差在远离吸收边时会减小。实测曲线与NIST-XCOM及NIST-FFAST曲线基本一致,测量值与NIST-XCOM理论值最大偏差不超过10.51%。
The exact value of the photon mass attenuation coefficient of a material needs to provide basic data for different fields.The monochromatic X-ray radiation device is an ideal device for the study of mass attenuation coefficient(μ/ρ)because the energy of the device is continuous and can be reconciled with the number of measured photons.The mass attenuation coefficient measurement method of Zn samples in the range of 8~20keV near the K absorption edge(9~11KeV)with 0.1keV step based on a monochromatic X-ray device is studied,and the experimental measurement values are compared with the NIST theoretical values.The results show that there is a maximum deviation near the K absorption edge jump,and the deviation decreases when moving away from the absorption edge.The measured curves are basically consistent with NIST-XCOM and NIST-FFAST curves,and the maximum deviation between the measured values and the theoretical values of NIST-XCOM is less than 10.51%.
作者
舒子瑶
郭思明
周幸
黄仕葵
樊丽鹏
李知微
王振
SHU Ziyao;GUO Siming;ZHOU Xing;HUANG Shikui;FAN Lipeng;LI Zhiwei;WANG Zhen(Chengdu University of Technology,Chengdu,Sichuan 610059,China;National Institute of Metrology,Beijing,100029,China)
出处
《计量学报》
CSCD
北大核心
2024年第8期1231-1235,共5页
Acta Metrologica Sinica
基金
国家科技基础条件平台项目(APT2301-7)
中国计量科学研究院基本科研业务费(AKYZZ2115,AKYZD2412)。
关键词
电离辐射计量
质量衰减系数
吸收边
单能X射线
ionizing radiation measurement
mass attenuation coefficient
absorption edge
monoenergetic X-rays
