摘要
开尔文探针力显微镜(KPFM)是一种以纳米级分辨率对材料表面进行电势测量的重要工具,由于其对材料表面电荷的敏感性,近年来在电介质电荷行为研究中获得了广泛应用。本文介绍了KPFM的原理,归纳了KPFM应用于电介质中电荷行为的最新研究进展,重点分析了电介质中表面、界面电荷的扩散、迁移机制,还对KPFM在无机材料、纳米复合材料、铁电材料等典型电介质中的应用研究进行了综述。
Kelvin probe force microscope(KPFM)is an important tool to measure the surface potential of materials with nanometer resolution.Because of its sensitivity to the surface charge of materials,it has been widely used in the research of dielectric charge behavior in recent years.This paper introduced the principle of KPFM,summarized the latest research progress of KPFM applied to charge behavior in dielectrics,focused on the analysis of the diffusion and migration mechanism of surface and interface charges in dielectrics.And the application of KPFM in typical dielectrics such as inorganic materials,nanocomposites,and ferroelectric materials were also reviewed.
作者
郭皓敏
张梓轩
贾贝贝
陈承相
吴锴
周峻
GUO Haomin;ZHANG Zixuan;JIA Beibei;CHEN Chengxiang;WU Kai;ZHOU Jun(State Key Laboratory of Electrical Insulation and Power Equipment,School of Electrical Engineering,Xi′an Jiaotong University,Xi′an 710049,China)
出处
《绝缘材料》
CAS
北大核心
2023年第10期1-11,共11页
Insulating Materials
基金
国家重点研发计划项目(2017YFB0903803)。
