摘要
汽车油漆是道路交通事故案中重要的物证信息之一,对现场收集的油漆物证进行比对检验检测,对事故的调查和认定提供了有力的科学依据。本文对油漆事故认定中的物证进行红外显微光谱和扫描电镜/X射线能谱联合分析,其中红外显微光谱法可以对事故现场收集的物证和嫌疑车辆样本进行红外光谱特征吸收峰和官能团比对分析,可以分析油漆的有机成分和种类;扫描电镜/X射线能谱法可以对事故现场收集的物证和嫌疑车辆样本的显微形态和无机元素成分进行比对。通过对实际案例中的样品分析,详细说明了红外显微光谱法和扫描电镜/X射线能谱法在物证分析中的优势。实验结果表明,红外显微光谱和扫描电镜/X射线能谱联合分析,可以对油漆物证进行快速、微量、无损检测,在目前油漆物证的分析研究中有着十分重要的优势。
Automobile paint is one of the important material evidence in road traffic accidents,the comparison test of paint samples collected on site provides a strong scientific basis for the investigation and identification of accidents.In this paper,the material evidence in the identification of paint accidents is analyzed by infrared microscopy and scanning electron microscopy/X-ray energy spectrum.Among them,infrared microscopic spectroscopy is used to analyze the infrared characteristic absorption peaks and functional groups of trace paint fragments collected at the scene of vehicle collision and suspected vehicle paint samples,which can analyze the organic components and types of paints.Scanning electron microscopy/X-ray spectroscopy allows comparison of microscopic morphology and inorganic element composition of paints from the accident scene and suspect vehicle.Through the analysis of samples in actual cases,the advantages of infrared microscopy and scanning electron microscopy/X-ray spectroscopy in the analysis of physical evidence are described in detail.The experimental results show that,the combined analysis of infrared microscopy and scanning electron microscopy/X-ray energy spectrum can be used for rapid,trace and non-destructive detection of paint evidence,and has incomparable advantages in the analysis and research of paint evidence.
作者
杨柳
谢红梅
钟宇
Yang Liu;Xie Hongmei;Zhong Yu(Safety Technology Center of Sichuan Coal Mine Safety Supervision Bureau,Chengdu 610041,China;Sichuan Zhuchuang Safety Technology Co.,Ltd.,Chengdu 610041,China)
出处
《山东化工》
CAS
2023年第9期154-156,共3页
Shandong Chemical Industry
关键词
油漆物证
红外显微光谱法
扫描电镜/X射线能谱法
paint evidence
infrared microspectroscopy
scanning electron microscopy/X-ray spectroscopy