摘要
静态光散射法能够实现水体悬浮颗粒物粒度分布的快速检测,但测量精度易受背景干扰。传统的样品散射光减背景光方法无法有效消除背景干扰。提出了基于散射光基线的背景干扰消除方法,在样品散射光减去背景干扰的基础上,拟合出散射光强分布基线,进一步消除背景的干扰。120μm及9.86μm标准粒径样品的测量结果表明,相较于传统方法,120μm样品的D_(10)、D_(50)以及D_(90)的测量相对误差分别由56.9%、17.2%、8.1%下降到0.4%、0.8%、2.8%;9.86μm样品的D_(10)、D_(50)以及D_(90)的测量相对误差分别由17.2%、10.0%、0.1%变到11.6%、3.4%、0.1%。表明基线法能够大幅提升背景干扰的去除效果,提高颗粒物粒度测量的准确性。
Objective Suspended particles in the water body deteriorate the water quality,hinder self-purification of the water body,and cause harm to fish.The particle sizes generally range from a few microns to hundreds of microns.Therefore,the automatic online particle size measurement of suspended particles in the water body plays a vital role in water environmental protection.At present,the laser scattering technology is a relatively mature and widely used particle size measurement technology.In the process of measuring the particle size distribution of suspended particles in water by static light scattering,the background interference is inevitable.Therefore,in order to obtain an accurate particle size distribution,it is necessary to eliminate background interference.Currently,the background interference is eliminated by subtracting the background light signal from the light scattering signal of the sample.However,the scattered light intensity of large particles and the background light intensity are mainly distributed in a small angle range.It is difficult to obtain an accurate scattered light intensity distribution of large particles by direct subtraction,which interferes with the measurement results,so the further spectral correction is required.Methods According to the principle of Mie’s scattering,the scattering experimental picture of a single particle size sample should be light-and-dark-alternating concentric rings.In addition,the farther away from the center of the ring,the lower the brightness,and the light intensity distribution is a fluctuation function with a gradual decay in amplitude.Theoretically,the trough of the light intensity distribution curve should be zero,but in reality,it is not zero because of the background interference.Therefore,a background correction method is needed to eliminate background interference as much as possible.This paper proposes a baseline-based background interference elimination method.First,the direct subtraction method is used to obtain the corrected sample scattered li
作者
石一鸣
殷高方
赵南京
石朝毅
贾仁庆
马明俊
刘灯奎
漆艳菊
夏蒙
甘婷婷
杨瑞芳
Shi Yiming;Yin Gaofang;Zhao Nanjing;Shi Chaoyi;Jia Renqing;Ma Mingjun;Liu Dengkui;Qi Yanju;Xia Meng;Gan Tingting;Yang Ruifang(Key Laboratory of Environmental Optics and Technology,Anhui Institute of Optics and Fine Mechanics,Chinese Academy of Sciences,Hefei,Anhui 230031,China;College of Biological Food and Environment,Hefei University,Hefei,Auhui 230601,China;College of Advanced Manufacturing Engineering,Hefei University,Hefei,Auhui 230601,China;College of Environmental Science and,Optoelectronic Technology,University of Science and Technology of China,Hefei,Auhui 230026,China;Institute of Physical Science and Information Technology,Anhui University,Hefei,Anhui 230601,China)
出处
《中国激光》
EI
CAS
CSCD
北大核心
2022年第7期63-69,共7页
Chinese Journal of Lasers
基金
中国科学院科研仪器设备研制项目(YJKYYQ20190050)
中国科学院环境光学与技术重点实验室开放基金(2005DP173065-2020-01)
安徽省科技重大专项(202003a07020007)
安徽省高校优秀青年人才支持计划项目(gxyq2021229)。
关键词
测量
背景干扰
悬浮颗粒物
粒度测量
CMOS探测器
measurement
background interference
suspended particulate matter
particle size measurement
CMOS detector
