摘要
针对硬盘头盘界面纳米级别微观接触问题,提出改进的GW接触模型计算微观接触力并引入分子间作用力建立头盘界面微观接触的力学模型,在此基础上建立头盘界面的两自由度动力学模型。利用龙格库塔方法求解不同接触状态下磁头的动态响应,结果表明:当磁头降低到一定飞行高度,头盘接触会导致磁头的自激振动,该动力学行为是造成磁头飞行失稳的关键因素。为了验证上述头盘界面接触动力学模型的准确性,选用物理参数相同的磁头开展过载状态下的动态响应测试,发现模型理论计算值与实验测试结果的相对误差不超过8%,验证了模型的准确性。
In view of the nanoscale contact behavior of head disk interface at present,the improved GW model is proposed to evaluate micro contact force.And the intermolecular force is also introduced to establish the contact mechanical model of the head disk interface.Then the two degree of freedom dynamic model is performed on this contact mechanical model.The dynamic response characteristics of head under different contact states is analyzed by Runge Kutta method.The results demonstrate that when the flying height is lowered to a certain value,the contact will induce the self-excited vibration of the head,which is a key issue that affects the flying instability of the head.To verify the accuracy of the head-disk interface contact dynamics model,the heads with the same physical parameters as the dynamic model are selected to perform the dynamic response test under overload condition.It shows that the relative error between the theoretical calculation value of the model and the experimental test result is less than 8%.
作者
王宇
张帆
晁世麟
訾艳阳
WANG Yu;ZHANG Fan;CHAO Shilin;ZI Yanyang(School of Mechanical Engineering,Xi’an Jiaotong University,Xi’an 710049)
出处
《机械工程学报》
EI
CAS
CSCD
北大核心
2022年第3期121-130,共10页
Journal of Mechanical Engineering
基金
国家自然科学基金资助项目(61633001,51875437)。
关键词
硬盘头盘界面
接触模型
自激振动
head disk interface
contact model
self-excited vibration
