摘要
随着集成电路的快速发展和工业物联网时代的逐渐到来,高性能、高可靠性的芯片制造成本越来越高。为保证芯片高质量生产,芯片的测试参数需要全覆盖,导致芯片测试所需的时间较长,成本较高。为降低芯片测试的成本,从数据分析的角度出发,就如何在保证产品质量的前提下科学降低芯片测试的时间和成本进行了研究。通过对实际测试数据的统计分析,表明所提方法可有效降低芯片测试的时间和成本。
With the rapid development of integrated circuits and the advent of the era of industrial internet of things,the cost of high-performance and high reliability chip manufacturing is getting higher and higher.In order to ensure the high quality of chip production,the test parameters of chip test need to be fully covered,which leads to the long time and high cost of chip test.Therefore,in order to reduce the cost of chip testing,how to scientifically reduce the time and cost of chip testing under the premise of ensuring product quality from the perspective of data analysis is studied.The statistical analysis of the actual test data shows that the proposed method can effectively reduce the time and cost of chip testing.
作者
王彬
刘伟
周成
WANG Bin;LIU Wei;ZHOU Cheng(China Key System&Integrated Circuit Co.,Ltd.,Wuxi 214072,China)
出处
《电子与封装》
2021年第12期31-34,共4页
Electronics & Packaging
基金
江苏省科技成果转化高性能实时微处理器系列产品研发及产业化(BA2019012)。
