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Causal analysis of competing atomistic mechanisms in ferroelectric materials from high-resolution scanning transmission electron microscopy data 被引量:2

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摘要 Machine learning has emerged as a powerful tool for the analysis of mesoscopic and atomically resolved images and spectroscopy in electron and scanning probe microscopy,with the applications ranging from feature extraction to information compression and elucidation of relevant order parameters to inversion of imaging data to reconstruct structural models.However,the fundamental limitation of machine learning methods is their correlative nature,leading to extreme susceptibility to confounding factors.Here,we implement the workflow for causal analysis of structural scanning transmission electron microscopy(STEM)data and explore the interplay between physical and chemical effects in a ferroelectric perovskite across the ferroelectric–antiferroelectric phase transitions.
出处 《npj Computational Materials》 SCIE EI CSCD 2020年第1期570-578,共9页 计算材料学(英文)
基金 The work at the University of Maryland was supported in part by the National Institute of Standards and Technology Cooperative Agreement 70NANB17H301 the Center for Spintronic Materials in Advanced infoRmation Technologies(SMART)one of centers in nCORE,a Semiconductor Research Corporation(SRC)program sponsored by NSF and NIST A.N.M.work was partially supported by the European Union’s Horizon 2020 research and innovation program under the Marie Skłodowska-Curie(grant agreement No 778070).
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