摘要
论文针对模数转换芯片ADS8364,分析了该ADC芯片的内部结构组成,并基于V93000 SOC自动测试系统进行了编程测试,测试结果能够反应器件特性。测试方法能广泛应用于其他ADC芯片测试。
In this paper,the internal structure of ADC ADS8364 is analyzed,and the programming test is carried out based on V93000 SOC automatic test system.The test results can truly reflect the device characteristics.The test method can be widely used to other ADC chip tests.
作者
王庆
WANG Qing(Wuhan Digital Engineering Institute,Wuhan 430205)
出处
《计算机与数字工程》
2021年第4期640-643,717,共5页
Computer & Digital Engineering
