摘要
为进一步降低Ag40CuZnSn银基钎料的熔化温度区间并提高其耐腐蚀性能,研究了In、Ga元素对Ag40CuZnSn银基钎料组织与电化学性能的影响。分别利用DSC热分析仪、金相显微镜对Ag40CuZnSn及添加了In、Ga元素的Ag40CuZnSn+xIn+yGa的熔化温度区间、显微组织进行了分析;并利用CHI600E型电化学分析仪对Ag40CuZnSn及添加了In、Ga元素的Ag40CuZnSn+xIn+yGa试样在3.5%NaCl溶液中的阻抗、极化曲线进行了测试;采用JSM-6460型扫描电镜对银基钎料基体不同相区及电化学试验试样腐蚀区域的形貌及化学成分进行了分析。结果表明:单独添加In、Ga元素可提高Ag40CuZnSn钎料中Ag基固溶体的含量,从而降低其熔化温度区间、提高自腐蚀电极电位;同时添加In、Ga元素提高了Ag40CuZnSn钎料中Cu基固溶体的含量,耐腐蚀性能有所下降;Ag40CuZnSn+xIn+yGa银基钎料在3.5%NaCl溶液中浸泡1 h后,腐蚀界面并无明显的容抗效应,表明在腐蚀过程中试样未形成氧化薄膜。
In order to further decrease the melting temperature range of Ag40CuZnSn fillers and improve the corrosion resistance,the effect of In and Ga elements on the microstructure and electrochemical performance of Ag40CuZnSn fillers were researched.The melting characterization,and microstructures of Ag40CuZnSn fillers with and without In and Ga elements were researched by DSC and metallurgical microscope.Moreover,electrochemical impedance spectroscopy(EIS),the dynamic polarization curves of Ag40CuZnSn filler with and without In and Ga elements were evaluated by CHI600E electrochemical analyze in 3.5%NaCl aqueous solution.The corrosion morphology and chemical composition at different phase fields of fillers were studied by JSM-6460 scanning electron microscope.Results showed that the individual addition of In element or Ga could significantly increase the Ag-based solid solution in the fillers,reduce the molting temperature range and improve the corrosion potentials.Adding indium and gallium elements at the same time could raise the Cu-based solid solution in fillers and decline the corrosion resistance.Besides,after immersed in 3.5%NaCl aqueous solution,the surface of the Ag40CuZnSn+xIn+yGa fillers did not performed obvious capacitance resistance,indicating there was no oxidation film formed during corrosion process.
作者
陈昊
邢健
朱绍珍
余建军
CHEN Hao;XING Jian;ZHU Shao-zhen;YU Jian-jun(Xi’an Noble Rare Metal Materials CO.,LTD,Xi’an 710201,China)
出处
《材料保护》
CAS
CSCD
北大核心
2020年第12期19-23,共5页
Materials Protection
