摘要
高压MnO2钽电容器燃烧的失效模式给高稳定、高可靠电子电路安全使用带来很大的隐患,介质氧化膜的晶化和其中的氧空位跃迁是导致漏电流增长的主要因素。涂覆绝缘树脂阻挡层在电介质表面,既可屏蔽表面晶化点,提高界面的势垒,又能降低电介质在被覆MnO2过程中的劣化。通过2倍额定电压和125℃环境条件V-I和T-I特性测试,揭示了温度和电压对极端条件下漏电流的作用机理,调整漏电流动力学公式中的欧姆和Poole-Frenkel电导率,高压MnO2钽电容器的正向V-I特性曲线与理论较好地吻合。该技术方法为高压MnO2型钽电容器在严酷环境中的安全使用提供支撑。
The failure mode of ignition of high voltage MnO2 tantalum capacitors brings great hidden danger to the safe use of high-stable and high-reliable electronic circuits.The crystallization of dielectric oxide film and the internal oxygen vacancy transition are the main factors leading to the increase of leakage current.Insulating resin coating on the dielectric surface can shield the surface crystallization point,improve the interface barrier,and reduce the dielectric degradation during the coating of MnO2.By V-I and T-I characterization at twice rated voltage and 125℃,the effect of temperature and voltage on leakage current was revealed for extreme conditions.By adjusting the Ohm and Poole-Frenkel conductivity in the leakage current dynamic formula,the forward V-I characteristic curve of the high voltage MnO2 tantalum capacitor is well consistent with the theory.This technical method provides support for the safe use of high voltage MnO2 tantalum capacitors in harsh environment.
作者
田东斌
胡鑫利
熊远根
刘兵
TIAN Dongbin;HU Xinli;XIONG Yuangen;LIU Bing(China Zhenhua(Group)Xinyun Electronic Components and Devices Co.,Ltd.,Guiyang 550018,China)
出处
《电子元件与材料》
CAS
CSCD
北大核心
2020年第12期22-26,共5页
Electronic Components And Materials
基金
贵州省科技计划项目(黔科合平台人才[2019]5649)。
关键词
高压
阻挡层
MnO2钽电容器
漏电流
稳定性
high voltage
carrier blocking layer
MnO2 tantalum capacitor
leakage current
stability
