摘要
为了充分地利用专家经验,以及电子产品研制和生产过程中产生的可靠性数据优化预计结果,FIDES、 SR 332和217Plus中给出了相应的失效率修正方法,包括过程评分法、试验数据修正法和现场数据修正法。分析了3类修正方法的原理和预计模型,基于优化示例对比分析了根据不同的预计手册得到的优化前的失效率、试验数据优化失效率和预计失效率、现场数据优化失效率和预计失效率。最后,指出电子产品可靠性预计需将手册预计方法与失效物理方法结合起来应用。
In order to optimize the predicted results by making full use of expert experience and reliability data generated during the development and production of electronic products, FIDES,SR332 and 217 Puls provide corresponding failure rate correction methods, including process scoring method, test data correction method and field data correction method. The principles and prediction models of the three types of correction methods are analyzed. Based on the optimization example, the failure rate before optimization, the optimization failure rate and the expected failure rate of test data, and the optimization failure rate and the expected failure rate of field data are compared and analyzed according to the different manuals. Finally, it is pointed out that it is necessary to combine the manuals. Finally, it is pointed out that it is necessary to combine the manual prediction method with the failure physical method for the reliability prediction of electronic products.
作者
聂国健
郑丽香
于迪
雷庭
李欣荣
NIE Guojian;ZHENG Lixiang;YU Di;LEI Ting;LI Xinrong(CEPREI,Guangzhou 510610,China)
出处
《电子产品可靠性与环境试验》
2020年第S02期97-100,共4页
Electronic Product Reliability and Environmental Testing
关键词
可靠性预计手册
过程评分法
试验数据修正法
现场数据修正法
reliability prediction handbook
process scoring method
test data correction method
field data correction method
